All Stories

  1. Strain induced power enhancement of far-UVC LEDs on high temperature annealed AlN templates
  2. The optimal threading dislocation density of AlN template for micrometer-thick Al0.63Ga0.37N heteroepitaxy
  3. Fingerprints of carbon defects in vibrational spectra of GaN considering the isotope effect
  4. In situ control of indium incorporation in (AlGa)1−xInxP layers
  5. Enhanced light extraction efficiency of UV LEDs by encapsulation with UV-transparent silicone resin
  6. Passively Q-switched microchip laser based picosecond light source in the visible-red to near-infrared band for semiconductor excitation
  7. High-quality AlGaN epitaxy on lattice-engineerable AlN template for high-power UVC light-emitting diodes
  8. Molten Barium Hydroxide as Defect Selective Drop Etchant for Dislocation Analysis on Aluminum Nitride Layers
  9. Impact of Si doping on dislocation behavior in MOVPE-grown AlN on high-temperature annealed AlN buffer layers
  10. Impact of operation parameters on the degradation of 233 nm AlGaN-based far-UVC LEDs
  11. Comparative Study of Monolithic Integrated MMI-Coupler-Based Dual-Wavelength Lasers
  12. Role of oxygen diffusion in the dislocation reduction of epitaxial AlN on sapphire during high-temperature annealing
  13. Internally wavelength stabilized GaAs-based diode lasers with epitaxially-stacked multiple active regions and tunnel junctions for LiDAR applications
  14. 16.3 W Peak-Power Pulsed All-Diode Laser Based Multi-Wavelength Master-Oscillator Power-Amplifier System at 964 nm
  15. Temperature Dependence of Dark Spot Diameters in GaN and AlGaN
  16. A carbon-doping related luminescence band in GaN revealed by below bandgap excitation
  17. High‐Temperature Annealing and Patterned AlN/Sapphire Interfaces
  18. Direct observation of resonant tunneling in heterostructure with a single quantum well
  19. Skin tolerant inactivation of multiresistant pathogens using far-UVC LEDs
  20. Advances towards deep-UV light emitting diode technologies
  21. 783 nm wavelength stabilized DBR tapered diode lasers with a 7 W output power
  22. Wedged Nd:YVO4 crystal for wavelength tuning of monolithic passively Q-switched picosecond microchip lasers
  23. Comparison of Ultraviolet B Light‐Emitting Diodes with Single or Triple Quantum Wells
  24. Origin of defect luminescence in ultraviolet emitting AlGaN diode structures
  25. Novel 900 nm diode lasers with epitaxially stacked multiple active regions and tunnel junctions
  26. Narrow spectral line-width 785 nm DBR tapered lasers with 7 W output power
  27. Single mode 660 nm master-oscillator power-amplifier with 500 mW optical output power
  28. Single-pass tapered semiconductor optical amplifiers and modules for efficient coherent beam combining
  29. Spatial filtering of a six-wavelength DBR-RW laser in a MOPA system
  30. Reliability of UVC LEDs fabricated on AlN/sapphire templates with different threading dislocation densities
  31. High-temperature annealing of AlN films grown on 4H–SiC
  32. Non-uniform longitudinal current density induced power saturation in GaAs-based high power diode lasers
  33. High‐Temperature Annealing of AlGaN
  34. The 2020 UV emitter roadmap
  35. Improved Efficiency of Ultraviolet B Light‐Emitting Diodes with Optimized p‐Side
  36. Longitudinal Current Crowding as Power Limit in High Power 975 nm Diode Lasers
  37. Impact of High‐Temperature Annealing on Boron Containing AlN Layers Grown by Metal Organic Vapor Phase Epitaxy
  38. Bulk photovoltaic effect in carbon-doped gallium nitride revealed by anomalous surface photovoltage spectroscopy
  39. Overcoming the excessive compressive strain in AlGaN epitaxy by introducing high Si-doping in AlN templates
  40. Carbon doping of GaN: Proof of the formation of electrically active tri-carbon defects
  41. The Impact of AlN Templates on Strain Relaxation Mechanisms during the MOVPE Growth of UVB‐LED Structures
  42. Low-index quantum-barrier single-pass tapered semiconductor optical amplifiers for efficient coherent beam combining
  43. Wavelength stabilized high pulse power 48 emitter laser bars for automotive light detection and ranging application
  44. Optimization of the Epitaxial Growth of Undoped GaN Waveguides in GaN-Based Laser Diodes Evaluated by Photoluminescence
  45. Structural and electrical properties of Pd/p-GaN contacts for GaN-based laser diodes
  46. Temperature‐Dependent Charge Carrier Diffusion in [0001¯] Direction of GaN Determined by Luminescence Evaluation of Buried InGaN Quantum Wells
  47. Highly Efficient High-Brightness 970-nm Ridge Waveguide Lasers
  48. Improved performance of UVC-LEDs by combination of high-temperature annealing and epitaxially laterally overgrown AlN/sapphire
  49. Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
  50. Status and Prospects of AlN Templates on Sapphire for Ultraviolet Light‐Emitting Diodes
  51. Surface Bragg gratings for high brightness lasers
  52. Designing sapphire surface patterns to promote AlGaN overgrowth in hydride vapor phase epitaxy
  53. Continuous-wave operation of DFB laser diodes based on GaN using 10$^{\rm th}$th-order laterally coupled surface gratings
  54. AlN overgrowth of nano-pillar-patterned sapphire with different offcut angle by metalorganic vapor phase epitaxy
  55. Improving AlN Crystal Quality and Strain Management on Nanopatterned Sapphire Substrates by High‐Temperature Annealing for UVC Light‐Emitting Diodes
  56. Monolithic Master Oscillator Tilted Tapered Power Amplifier Emitting 9.5 W at 1060 nm
  57. Enhanced wall plug efficiency of AlGaN-based deep-UV LEDs using Mo/Al as p-contact
  58. Determination of Sapphire Off‐Cut and Its Influence on the Morphology and Local Defect Distribution in Epitaxially Laterally Overgrown AlN for Optically Pumped UVC Lasers
  59. Displacement Talbot lithography for nano-engineering of III-nitride materials
  60. Determination of Sapphire Off‐Cut and Its Influence on the Morphology and Local Defect Distribution in Epitaxially Laterally Overgrown AlN for Optically Pumped UVC Lasers
  61. Broadband Semiconductor Light Sources Operating at 1060 nm Based on InAs:Sb/GaAs Submonolayer Quantum Dots
  62. Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
  63. Growth and Properties of Intentionally Carbon‐Doped GaN Layers
  64. Approaches for higher power in GaAs-based broad area diode lasers
  65. High pulse power wavelength stabilized 905 nm laser bars for automotive LiDAR
  66. High power broad-area lasers with buried implantation for current confinement
  67. Influence of substrate off-cut angle on the performance of 310 nm light emitting diodes
  68. Extra half-plane shortening of dislocations as an origin of tensile strain in Si-doped (Al)GaN
  69. Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes
  70. Continuous Wave THz Source Based on an Electrically Tunable Monolithic Two-Color Semiconductor Diode Laser
  71. Dual-Wavelength Y-Branch DBR-RW Diode Laser at 785 nm with Adjustable Spectral Distance from 0 up to 1.6 nm
  72. Efficient Narrow Stripe Ridge Waveguide Lasers for Single-Spatial Mode Operation up to 2.5 W
  73. Optimization of 808 nm DBR RW Laser Bars for Operation at Low Noise and High Reliability
  74. Polarisation-Resolved Investigations of the Pico- and Nanosecond Dynamics of Broad Area Distributed Bragg Reflector Lasers under Very High-Current Pulse Excitation
  75. Wavelength Stabilized 905 nm Diode Lasers in the 100 W Class for Automotive LiDAR
  76. Widely Tunable Watt-Level MOPA Systems Emitting at 976 nm
  77. Time-resolved photoluminescence from n-doped GaN/Al0.18Ga0.82N short-period superlattices probes carrier kinetics and long-term structural stability
  78. MOVPE-grown AlGaN-based tunnel heterojunctions enabling fully transparent UVC LEDs
  79. High power UVB light emitting diodes with optimized n-AlGaN contact layers
  80. Impact of intermediate high temperature annealing on the properties of AlN/sapphire templates grown by metalorganic vapor phase epitaxy
  81. Degradation of (In)AlGaN-Based UVB LEDs and Migration of Hydrogen
  82. Current spreading suppression by O- and Si-implantation in high power broad area diode lasers
  83. High-power-class QCW red laser bars and stacks for pump and direct application
  84. Highly reliable low noise pump sources for solid state lasers in laser communication terminals
  85. AlN and AlN/Al2O3 seed layers from atomic layer deposition for epitaxial growth of AlN on sapphire
  86. Tunable Y-branch dual-wavelength diode lasers in the VIS and NIR range for sensor applications
  87. Characterization and comparison between two coupling concepts of four-wavelength monolithic DBR ridge waveguide diode laser at 970 nm
  88. Stabilization of sputtered AlN/sapphire templates during high temperature annealing
  89. Crystal defect analysis in AlN layers grown by MOVPE on bulk AlN
  90. Tri-carbon defects in carbon doped GaN
  91. Crystal damage analysis of implanted AlxGa1-xN (0 ≤ x ≤ 1) by ion beam techniques
  92. Optical investigations of europium ion implanted in nitride-based diode structures
  93. Influence of silicon doping on internal quantum efficiency and threshold of optically pumped deep UV AlGaN quantum well lasers
  94. Influence of quartz on silicon incorporation in HVPE grown AlN
  95. Bow Reduction of AlInGaN-Based Deep UV LED Wafers Using Focused Laser Patterning
  96. High-power sampled-grating-based master oscillator power amplifier system with 235  nm wavelength tuning around 970  nm
  97. Efficient iron doping of HVPE GaN
  98. Characterisation and comparison between different S-bend shaped GaAs Y-branch distributed Bragg reflector lasers emitting at 976 nm
  99. Near Infrared Diode Laser THz Systems
  100. Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics
  101. High Pulse Power Wavelength Stabilized Laser Diodes for Automotive LiDAR
  102. Localization of current-induced degradation effects in (InAlGa)N-based UV-B LEDs
  103. Degradation behavior of AlGaN-based 233 nm deep-ultraviolet light emitting diodes
  104. Reduction of absorption losses in MOVPE-grown AlGaAs Bragg mirrors
  105. Eu-Doped AlGaN/GaN Superlattice-Based Diode Structure for Red Lighting: Excitation Mechanisms and Active Sites
  106. Lifetime behavior of laser diodes with highly strained InGaAs QWs and emission wavelength between 1120 nm and 1180 nm
  107. Compact continuous wave THz source based on monolithic two-color laser diode
  108. Impact of open-core threading dislocations on the performance of AlGaN metal-semiconductor-metal photodetectors
  109. Ultrafast carrier dynamics in a GaN/Al0.18Ga0.82N superlattice
  110. Advanced in-situ control for III-nitride RF power device epitaxy
  111. Wavelength stabilized high pulse power laser diodes for automotive LIDAR
  112. High-Efficiency Broad-Ridge Waveguide Lasers
  113. Degradation effects of the active region in UV-C light-emitting diodes
  114. GaN-Based Vertical n -Channel MISFETs on Free Standing Ammonothermal GaN Substrates
  115. Red-emitting distributed-feedback ridge-waveguide laser based on high-order surface grating
  116. Diffraction limited 1064nm monolithic DBR-master oscillator power amplifier with more than 7W output power
  117. Influence of template properties and quantum well number on stimulated emission from Al0.7Ga0.3N/Al0.8Ga0.2N quantum wells
  118. Influence of different approaches for dynamical performance optimization of monolithic passive colliding-pulse mode-locked laser diodes emitting around 850 nm
  119. Reflectors and tuning elements for widely-tunable GaAs-based sampled grating DBR lasers
  120. 5.5nm wavelength-tunable high-power MOPA diode laser system at 971 nm
  121. 970-nm ridge waveguide diode laser bars for high power DWBC systems
  122. Comparison for 1030nm DBR-tapered diode lasers with 10W central lobe output power and different grating layouts for wavelength stabilization and lateral spatial mode filtering
  123. Pico- and nanosecond investigations of the lateral nearfield of broad area lasers under pulsed high-current excitation
  124. Si impurity concentration in nominally undoped Al 0.7 Ga 0.3 N grown in a planetary MOVPE reactor
  125. AlGaN-based deep UV LEDs grown on sputtered and high temperature annealed AlN/sapphire
  126. AFM characterization of AlGaAs/AlAs distributed Bragg reflectors
  127. TEM investigations of oxidation phenomena in (Al,Ga)As/AlAs
  128. Wavelength-Stabilized High-Pulse-Power Laser Diodes for Automotive LiDAR
  129. Analysis of strain and composition distributions in laterally strain-modulated InGaAs nanostructures after overgrowth with GaAs or InGaP
  130. High power Y-branch MOPA-system with 9.7 nm wavelength tunability for IR up-conversion detection
  131. Highly Reflective p-Contacts Made of Pd-Al on Deep Ultraviolet Light-Emitting Diodes
  132. Effect of the GaN:Mg Contact Layer on the Light-Output and Current-Voltage Characteristic of UVB LEDs
  133. Effect of Electron Blocking Layer Doping and Composition on the Performance of 310 nm Light Emitting Diodes
  134. High-quality AlN grown on a thermally decomposed sapphire surface
  135. Orientation dependent indium incorporation in MOVPE grown InGaAs/GaAs quantum wells
  136. Compact High Power Diode Laser MOPA System With 5.5 nm Wavelength Tunability
  137. On the EQE-bias characteristics of bottom-illuminated AlGaN-based metal-semiconductor-metal photodetectors with asymmetric electrode geometry
  138. Chip design for thin-film deep ultraviolet LEDs fabricated by laser lift-off of the sapphire substrate
  139. MOVPE growth of violet GaN LEDs on β -Ga 2 O 3 substrates
  140. Efficient, High Brightness 1030 nm DBR Tapered Diode Lasers With Optimized Lateral Layout
  141. Extended 97  nm tuning range in a MOPA system with a tunable dual grating Y-branch laser
  142. 10.5 W central lobe output power obtained with an efficient 1030 nm DBR tapered diode laser
  143. Monolithically wavelength-stabilized high power diode lasers
  144. Reduction of Optical Feedback Originating From Ferroelectric Domains of Periodically Poled Crystals
  145. Effect of Cl2 plasma treatment and annealing on vanadium based metal contacts to Si-doped Al0.75Ga0.25N
  146. Comparison of symmetric and asymmetric double quantum well extended-cavity diode lasers for broadband passive mode-locking at 780  nm
  147. DFB lasers with apodized surface gratings for wavelength stabilization and high efficiency
  148. Avoidance of instable photoluminescence intensity from AlGaN bulk layers
  149. Design and realization of a widely tunable sampled-grating distributed-Bragg reflector (SG DBR) laser emitting at 976 nm
  150. Development of a compact mode-locked ECDL for precision frequency comparison experiments at 780 nm
  151. Realisation of a widely tuneable sampled grating DBR laser emitting around 970 nm
  152. High-power broad-area buried-mesa lasers
  153. Metamorphic Al 0.5 Ga 0.5 N:Si on AlN/sapphire for the growth of UVB LEDs
  154. Design considerations for AlGaN-based UV LEDs emitting near 235 nm with uniform emission pattern
  155. Gas Sensing of Nitrogen Oxide Utilizing Spectrally Pure Deep UV LEDs
  156. Silicon induced defect reduction in AlN template layers for epitaxial lateral overgrowth
  157. Non-uniform DFB-surface-etched gratings for enhanced performance high power, high brightness broad area lasers
  158. 1030-nm diode-laser-based light source delivering pulses with nanojoule energies and picosecond duration adjustable by mode locking or pulse gating operation
  159. 1030nm DBR tapered diode laser with up to 16 W of optical output power
  160. 785nm dual-wavelength Y-branch DBR-RW diode laser with electrically adjustable wavelength distance between 0 nm and 2 nm
  161. Influence of AlN buffer layer on growth of AlGaN by HVPE
  162. The effects of magnesium doping on the modal loss in AlGaN-based deep UV lasers
  163. Picosecond pulsed micro-module emitting near 560 nm using a frequency doubled gain-switched DBR ridge waveguide semiconductor laser
  164. AlGaN-based metal-semiconductor-metal photodetectors with high external quantum efficiency at low operating voltage
  165. Terahertz frequency generation
  166. In-situ photoluminescence measurements during MOVPE of GaN and InGaN in a CCS reactor
  167. Astigmatism-free high-brightness 1060 nm edge-emitting lasers with narrow circular beam profile
  168. Triangular-shaped sapphire patterning for HVPE grown AlGaN layers
  169. Generation of optical picosecond pulses with monolithic colliding-pulse mode-locked (CPM) lasers containing a chirped double quantum well active region
  170. Fe-doping in hydride vapor-phase epitaxy for semi-insulating gallium nitride
  171. Strong amplitude-phase coupling in submonolayer quantum dots
  172. Increased diffraction efficiencies of DBR gratings in diode lasers with adiabatic ridge waveguides
  173. Near-field microscopy of waveguide architectures of InGaN/GaN diode lasers
  174. Role of substrate quality on the performance of semipolar (112¯2) InGaN light-emitting diodes
  175. In-situ control of large area (11–22)-GaN growth on patterned r -plane sapphire
  176. Temperature and doping dependent changes in surface recombination during UV illumination of (Al)GaN bulk layers
  177. Exciton localization in semipolar ( 112¯2) InGaN multiple quantum wells
  178. Dual-wavelength diode laser with electrically adjustable wavelength distance at 785  nm
  179. AlN growth on nano-patterned sapphire: A route for cost efficient pseudo substrates for deep UV LEDs
  180. Structural and optical properties of (112̅2) InGaN quantum wells compared to (0001) and (112̅0)
  181. Study of damage formation and annealing of implanted III-nitride semiconductors for optoelectronic devices
  182. Correlation of sapphire off-cut and reduction of defect density in MOVPE grown AlN [Phys. Status Solidi B253, 809-813 (2016)]
  183. Quantification of matrix and impurity elements in AlxGa1−xN compounds by secondary ion mass spectrometry
  184. Kinetics of AlGaN metal–organic vapor phase epitaxy for deep-UV applications
  185. Freely Triggerable Picosecond Pulses From a DBR Ridge Waveguide Diode Laser Near 1120 nm
  186. Correlation of sapphire off-cut and reduction of defect density in MOVPE grown AlN
  187. Low absorption loss p-AlGaN superlattice cladding layer for current-injection deep ultraviolet laser diodes
  188. DBR tapered diode laser with 12.7 W output power and nearly diffraction-limited, narrowband emission at 1030 nm
  189. Mechanisms of Implantation Damage Formation in AlxGa1–xN Compounds
  190. Development of semipolar (11-22) LEDs on GaN templates
  191. Process control of MOCVD growth for LEDs by in-situ photoluminescence
  192. DBR tapered diode laser at 1030 nm with nearly diffraction-limited narrowband emission and 12.7 W of optical output power
  193. Generation of 7W nanosecond pulses with 670nm ridge-waveguide lasers
  194. Determination of polarization fields in group III-nitride heterostructures by capacitance-voltage-measurements
  195. Novel approaches to increasing the brightness of broad area lasers
  196. Terahertz wave generation from dual wavelength monolithic integrated distributed Bragg reflector semiconductor laser diode
  197. Influence of the LED heterostructure on the degradation behavior of (InAlGa)N-based UV-B LEDs
  198. MOVPE growth of laser structures for high-power applications at different ambient temperatures
  199. CBr 4 -based in-situ etching of GaAs, assisted with TMAl and TMGa
  200. High power surface-grating stabilized narrow-stripe broad area lasers with beam parameter product < 2 mm×mrad
  201. Measurement and simulation of top- and bottom-illuminated solar-blind AlGaN metal-semiconductor-metal photodetectors with high external quantum efficiencies
  202. Defect distribution and compositional inhomogeneities in Al0.5Ga0.5N layers grown on stepped surfaces
  203. Solar- and Visible-Blind AlGaN Photodetectors
  204. Vapor Phase Epitaxy of AlGaN Base Layers on Sapphire Substrates for Nitride-Based UV-Light Emitters
  205. Efficient carrier-injection and electron-confinement in UV-B light-emitting diodes
  206. High Temperature Operation of 1060-nm High-Brightness Photonic Band Crystal Lasers With Very Low Astigmatism
  207. High-Power Distributed Feedback Lasers With Surface Gratings: Theory and Experiment
  208. Femtosecond Mode-Locked Semiconductor Disk Lasers
  209. Spatial inhomogeneities in AlxGa1−xN quantum wells induced by the surface morphology of AlN/sapphire templates
  210. V-pit to truncated pyramid transition in AlGaN-based heterostructures
  211. Impact of acceptor concentration on the resistivity of Ni/Au p-contacts on semipolar (20-21) GaN:Mg
  212. Strongly transverse-electric-polarized emission from deep ultraviolet AlGaN quantum well light emitting diodes
  213. Solar-blind AlGaN MSM photodetectors with 24% external quantum efficiency at 0 V
  214. High power picosecond and nanosecond diode laser sources in the wavelength range 650 nm to 1100 nm
  215. Study of lateral brightness in 20 μm to 50 μm wide narrow stripe broad area lasers
  216. Limitations to brightness in high power laser diodes
  217. UV-C Lasing From AlGaN Multiple Quantum Wells on Different Types of AlN/Sapphire Templates
  218. On optical polarization and charge carrier statistics of nonpolar InGaN quantum wells
  219. Degradation of (InAlGa)N-based UV-B light emitting diodes stressed by current and temperature
  220. 24-wavelength distributed Bragg reflector laser array with surface gratings
  221. Spatial clustering of defect luminescence centers in Si-doped low resistivity Al0.82Ga0.18N
  222. 25-W Monolithic Spectrally Stabilized 975-nm Minibars for Dense Spectral Beam Combining
  223. Deep ultraviolet LEDs: From materials research to real-world applications
  224. Semipolar (112―2) InGaN light-emitting diodes grown on chemically-mechanically polished GaN templates
  225. Comparison of two concepts for dual-wavelength DBR ridge waveguide diode lasers at 785 nm suitable for shifted excitation Raman difference spectroscopy
  226. In-situ observation of InGaN quantum well decomposition during growth of laser diodes
  227. Watt-level continuous-wave diode lasers at 1180 nm with high spectral brightness
  228. In-situ photoluminescence measurements during MOVPE growth of GaN and InGaN MQW structures
  229. Effect of carrier gas in hydride vapor phase epitaxy on optical and structural properties of GaN
  230. Semi-polar (112¯2)-GaN templates grown on 100 mm trench-patternedr-plane sapphire
  231. Current spreading in UV-C LEDs emitting at 235 nm
  232. High-power UV-B LEDs with long lifetime
  233. Development of high-power diode lasers with beam parameter product below 2 mm×mrad within the BRIDLE project
  234. Generation of spectrally-stable continuous-wave emission and ns pulses at 800 nm and 975 nm with a peak power of 4 W using a distributed Bragg reflector laser and a ridge-waveguide power amplifier
  235. 785-nm dual wavelength DBR diode lasers and MOPA systems with output powers up to 750 mW
  236. Shifted excitation Raman difference spectroscopy using a dual-wavelength DBR diode laser at 785 nm
  237. Combined Mg/Zn p-type doping for AlGaInP laser diodes
  238. Growth of laser diode structures with emission wavelength beyond 1100nm for yellow–green emission by frequency conversion
  239. AlAsP-based strain-balancing in MOVPE-grown distributed Bragg reflectors
  240. Analysis of HVPE grown AlGaN layers on honeycomb patterned sapphire
  241. Top- and bottom-illumination of solar-blind AlGaN metal-semiconductor-metal photodetectors
  242. High peak power pulse generation from PBC lasers
  243. Enhanced quantum efficiency of AlGaN photodetectors by patterned growth
  244. Effect of quantum well non-uniformities on lasing threshold, linewidth, and lateral near field filamentation in violet (Al,In)GaN laser diodes
  245. High brightness photonic band crystal semiconductor lasers in the passive mode locking regime
  246. 1.9 W continuous-wave single transverse mode emission from 1060 nm edge-emitting lasers with vertically extended lasing area
  247. Generation of spectrally stable continuous-wave emission and ns pulses with a peak power of 4 W using a distributed Bragg reflector laser and a ridge-waveguide power amplifier
  248. Nano-optical analysis of GaN-based diode lasers
  249. Defect analysis in AlGaN layers on AlN templates obtained by epitaxial lateral overgrowth
  250. Impact of electron irradiation on electron holographic potentiometry
  251. Efficient charge carrier injection into sub-250 nm AlGaN multiple quantum well light emitting diodes
  252. Analysis of crystal orientation in AlN layers grown on m-plane sapphire
  253. Factors influencing brightness and beam quality of conventional and distributed Bragg reflector tapered laser diodes in absence of self-heating
  254. Influence of barrier growth schemes on the structural properties and thresholds of InGaN quantum well laser diodes
  255. Narrow Stripe Broad Area Lasers With High Order Distributed Feedback Surface Gratings
  256. Narrow-stripe broad-area lasers with distributed-feedback surface gratings as brilliant sources for high power spectral beam combining systems
  257. Wavelength stabilized 785 nm DBR-ridge waveguide lasers with an output power of up to 215 mW
  258. Red emitting monolithic dual wavelength DBR diode lasers for shifted excitation Raman difference spectroscopy
  259. Shifted excitation Raman difference spectroscopy using a dual-wavelength DBR diode laser at 671 nm
  260. Surface topology caused by dislocations in polar, semipolar, and nonpolar InGaN/GaN heterostructures
  261. Polarization of photoluminescence emission from semi-polar (11–22) AlGaN layers
  262. Solar-blind AlxGa1-xN MSM photodetectors on patterned AlN/sapphire templates with 0.4 < x < 1
  263. Performance Characteristics of UV-C AlGaN-Based Lasers Grown on Sapphire and Bulk AlN Substrates
  264. MOVPE growth of AlxGa1-xN with x ∼ 0.5 on epitaxial laterally overgrown AlN/sapphire templates for UV-LEDs
  265. Double Heterostructure AlGaAs/GaAs W-shaped Waveguide Mach-Zehnder Intensity Modulator for 780 nm Lasers
  266. Anisotropic Responsivity of AlGaN Metal–Semiconductor–Metal Photodetectors on Epitaxial Laterally Overgrown AlN/Sapphire Templates
  267. Hydride Vapor-Phase Epitaxy of c-Plane AlGaN Layers on Patterned Sapphire Substrates
  268. Techniques towards GaN power transistors with improved high voltage dynamic switching properties
  269. Suppression of Higher-Order Lateral Modes in Broad-Area Diode Lasers by Resonant Anti-Guiding
  270. Cathodoluminescence and TEM investigations of structural and optical properties of AlGaN on epitaxial laterally overgrown AlN/sapphire templates
  271. Origin of a-plane (Al,Ga)N formation on patterned c-plane AIN/sapphire templates
  272. Excitonic recombination in epitaxial lateral overgrown AlN on sapphire
  273. Highly conductive n-AlxGa1−xN layers with aluminum mole fractions above 80%
  274. Investigation of the temperature dependent efficiency droop in UV LEDs
  275. Electrical properties and microstructure of vanadium-based contacts on ICP plasma etched n-type AlGaN:Si and GaN:Si surfaces
  276. Double-heterostructure ridge-waveguide GaAs/AlGaAs phase modulator for 780 nm lasers
  277. Degradation processes in high-power diode lasers under external optical feedback
  278. Optical pulse generation in photonic band crystal mode locked lasers
  279. High Brightness, Narrow Bandwidth DBR Diode Lasers at 1120 nm
  280. High-brilliance diode lasers with monolithically-integrated surface gratings as sources for spectral beam combining
  281. Breakdown and dynamic effects in GaN power switching devices
  282. Stress evolution during AlxGa1−xN/AlN growth on sapphire
  283. High quality AlGaN grown on ELO AlN/sapphire templates
  284. Quantum Efficiency Analysis of Near-Ultraviolet Emitting AlGaN and AlInGaN Structures
  285. Influence of Carrier Lifetime, Transit Time, and Operation Voltages on the Photoresponse of Visible-Blind AlGaN Metal–Semiconductor–Metal Photodetectors
  286. AlGaN Metal–Semiconductor–Metal Photodetectors on Planar and Epitaxial Laterally Overgrown AlN/Sapphire Templates for the Ultraviolet C Spectral Region
  287. Waveguide Optimization for Semipolar (In,Al,Ga)N Lasers
  288. Linear thermal expansion coefficient determination using in situ curvature and temperature dependent X-ray diffraction measurements applied to metalorganic vapor phase epitaxy-grown AlGaAs
  289. Characterization of semiconductor devices and wafer materials via sub-nanosecond time-correlated single-photon counting
  290. Monolithic Y-branch dual wavelength DBR diode laser at 671nm for shifted excitation Raman difference spectroscopy
  291. Dual-wavelength monolithic Y-branch distributed Bragg reflection diode laser at 671 nm suitable for shifted excitation Raman difference spectroscopy
  292. MOVPE growth of Al0.85Ga0.15As for high power laser diodes emitting at 808nm
  293. Tunable and highly brilliant laser sources at 1120 nm
  294. MOVPE-grown AlxGa1−xAsyP1−y strain compensating layers on GaAs
  295. Phase control of semi-polar and non-polar GaN on cone shaped r-plane patterned sapphire substrates
  296. In-situ etching of patterned GaAs/InGaP surfaces for highly efficient 975nm DFB-BA diode lasers
  297. Impact of AlN nucleation layer on strain in GaN grown on 4H-SiC substrates
  298. Monolithic Y-branch dual wavelength DBR diode laser at 671 nm for shifted excitation Raman difference spectroscopy
  299. Controlled coalescence of MOVPE grown AlN during lateral overgrowth
  300. Device Breakdown and Dynamic effects in GaN Power Switching Devices: Dependencies on Material Properties and Device Design
  301. (Invited) Technological Approaches Towards High Voltage, Fast Switching GaN Power Transistors
  302. Predominant growth of non-polar a-plane (Al,Ga)N on patterned c-plane sapphire by hydride vapor phase epitaxy
  303. 1120nm highly brilliant laser sources for SHG-modules in bio-analytics and spectroscopy
  304. The impact of external optical feedback on the degradation behavior of high-power diode lasers
  305. Y-branch coupled DFB-lasers based on high-order Bragg gratings for wavelength stabilization
  306. Effective Thermal Management in Ultraviolet Light-Emitting Diodes With Micro-LED Arrays
  307. Optimization of GaN wafer bow grown on cone shaped patterned sapphire substrates
  308. AlGaN photodetectors for the UV-C spectral region on planar and epitaxial laterally overgrown AlN/sapphire templates
  309. HVPE growth of thick Al0.45Ga0.55N layers on trench patterned sapphire substrates
  310. Diode laser based light sources for biomedical applications
  311. Si Doping of GaN in Hydride Vapor-Phase Epitaxy
  312. AlGaN layer structures for deep UV emitters on laterally overgrown AlN/sapphire templates
  313. Impact of light polarization on photoluminescence intensity and quantum efficiency in AlGaN and AlInGaN layers
  314. Indium incorporation efficiency and critical layer thickness of (202¯1) InGaN layers on GaN
  315. Watt-class green-emitting laser modules using direct second harmonic generation of diode laser radiation
  316. Effect of TMGa preflow on the properties of high temperature AlN layers grown on sapphire
  317. Topography of AlGaN, GaN and InGaN layers grown by metal-organic vapor phase epitaxy
  318. Modulated Epitaxial Lateral Overgrowth of AlN for Efficient UV LEDs
  319. Analysis of doping induced wafer bow during GaN:Si growth on sapphire
  320. Spacer and well pumping of InGaN vertical cavity semiconductor lasers with varying number of quantum wells
  321. High-Power Distributed Feedback Lasers With Surface Gratings
  322. HVPE of AlxGa1−xN layers on planar and trench patterned sapphire
  323. Investigation of GaAs based MOVPE-grown AlxGa1−xAsyP1−y strain compensating layers
  324. Experimental and theoretical study of finite-aperture tapered unstable resonator lasers
  325. Buried DFB gratings floating in AlGaAs with low oxygen contamination enable high power and efficiency DFB lasers
  326. Growth of GaN boules via vertical HVPE
  327. Factors influencing the brightness and beam quality of tapered laser diodes and bars
  328. In situ etched gratings embedded in AlGaAs for efficient high power 970 nm distributed feedback broad-area lasers
  329. 96 mW longitudinal single mode red-emitting distributed Bragg reflector ridge waveguide laser with tenth order surface gratings
  330. 1060-nm Ridge Waveguide Lasers Based on Extremely Wide Waveguides for 1.3-W Continuous-Wave Emission Into a Single Mode With FWHM Divergence Angle of $9^{\circ}\times 6^{\circ}$
  331. Properties and fabrication of high-order Bragg gratings for wavelength stabilization of diode lasers
  332. 10-W reliable 90-μm-wide broad area lasers with internal grating stabilization
  333. All-semiconductor-based narrow linewidth high-power laser system for laser communication applications in space at 1060 nm
  334. Harmonically and fundamentally mode-locked InGaAs-AlGaAs disk laser generating pulse repetition rates in the 100 GHz or pulse durations in the 100-fs range
  335. 100,000 h estimated lifetime of 100-μm-stripe width 650 nm broad area lasers at an output power of 1.2 W
  336. Generation of picosecond pulses and optical frequency combs with multi-section 1065nm ridge waveguide diode lasers
  337. Red-emitting diode lasers with internal surface DBR gratings
  338. Indium incorporation and emission wavelength of polar, nonpolar and semipolar InGaN quantum wells
  339. Polarization of eigenmodes and the effect on the anisotropic gain in laser structures on nonpolar and semipolar GaN
  340. Auger effect in nonpolar quantum wells
  341. High-power low-divergence 1060 nm photonic crystal laser diodes based on quantum dots
  342. High-Power, High-Efficiency Monolithic Edge-Emitting GaAs-Based Lasers with Narrow Spectral Widths
  343. Effect of temperature and strain on the optical polarization of (In)(Al)GaN ultraviolet light emitting diodes
  344. Investigation of inversion domain formation in AlN grown on sapphire by MOVPE
  345. High-power, spectrally stabilized, near-diffraction-limited 970 nm laser light source based on truncated-tapered semiconductor optical amplifiers with low confinement factors
  346. Spectral properties of polarized light from semipolar grown InGaN quantum wells at low temperatures
  347. Polarization dependent study of gain anisotropy in semipolar InGaN lasers
  348. 56W optical output power at 970nm from a truncated tapered semiconductor optical amplifier
  349. Strong charge carrier localization interacting with extensive nonradiative recombination in heteroepitaxially grown m-plane GaInN quantum wells
  350. 20 000 h reliable operation of 100 µm stripe width 650 nm broad area lasers at more than 1.1 W output power
  351. Enhancement of channel conductivity in AlGaN/GaN heterostructure field effect transistors by AlGaN:Si back barrier
  352. Reliability issues of GaN based high voltage power devices
  353. On the optical polarization properties of semipolar InGaN quantum wells
  354. Tilted Wave Lasers: A Way to High Brightness Sources of Light
  355. Comparative study of buffer designs for high breakdown voltage AlGaNGaN HFETs
  356. Optimisation of 660 nm high-power tapered diode lasers
  357. High gain ultraviolet photodetectors based on AlGaN/GaN heterostructures for optical switching
  358. Study of excess carrier dynamics in polar, semi-polar, and non-polar (In,Ga)N epilayers and QWs
  359. GaInN quantum well design and measurement conditions affecting the emission energy S-shape
  360. (Al,Ga)N overgrowth over AlN ridges oriented in [1120] and [1100] direction
  361. GaN boules grown by high rate HVPE
  362. Pulse repetition rate up to 92 GHz or pulse duration shorter than 110 fs from a mode-locked semiconductor disk laser
  363. Optical polarization of UV-A and UV-B (In)(Al)GaN multiple quantum well light-emitting diodes
  364. Impact of band structure and transition matrix elements on polarization properties of the photoluminescence of semipolar and nonpolar InGaN quantum wells
  365. 1W semiconductor based laser module with a narrow linewidth emitting near 1064nm
  366. Surface morphology of homoepitaxial GaN grown on non- and semipolar GaN substrates
  367. Characterization and optimization of 2-step MOVPE growth for single-mode DFB or DBR laser diodes
  368. High-power edge-emitting laser diode with narrow vertical beam divergence
  369. Growth of AlGaN and AlN on patterned AlN/sapphire templates
  370. Uniformity of the wafer surface temperature during MOVPE growth of GaN-based laser diode structures on GaN and sapphire substrate
  371. Growth and characterization of heavily selenium doped GaAs using MOVPE
  372. (Invited) High Voltage Normally-Off Transistors and Efficient Schottky Diodes based on GaN Technology
  373. Application of GaN-based ultraviolet-C light emitting diodes – UV LEDs – for water disinfection
  374. AlGaN-based Ultraviolet Lasers - Applications and Materials Challenges
  375. Advances in group III-nitride-based deep UV light-emitting diode technology
  376. Well width study of InGaN multiple quantum wells for blue–green emitter
  377. GaN-based ultraviolet light-emitting diodes with multifinger contacts
  378. Tilted waveguide and PBC lasers: Novel cavity designs for narrow far-fields and high brightness
  379. Optical polarization characteristics of ultraviolet (In)(Al)GaN multiple quantum well light emitting diodes
  380. Improving the modulation efficiency of high-power distributed Bragg reflector tapered diode lasers
  381. Broad-area lasers with internal surface Bragg gratings for wavelength stabilization at 980nm
  382. Hydride vapor phase epitaxy of GaN boules using high growth rates
  383. Orientation control of GaN and grown on sapphire by metal-organic vapor phase epitaxy
  384. Effects of low charge carrier wave function overlap on internal quantum efficiency in GaInN quantum wells
  385. (In)AlGaN deep ultraviolet light emitting diodes with optimized quantum well width
  386. High-Power Pulse Generation in GHz Range With 1064-nm DBR Tapered Laser
  387. Facet formation for laser diodes on nonpolar and semipolar GaN
  388. InGaN–GaN Disk Laser for Blue-Violet Emission Wavelengths
  389. Carrier injection in InAlGaN single and multi-quantum-well ultraviolet light emitting diodes
  390. Optical and Structural Properties of In0.08GaN/In0.02GaN Multiple Quantum Wells Grown at Different Temperatures and with Different Indium Supplies
  391. Laser Scribing for Facet Fabrication of InGaN MQW Diode Lasers on Sapphire Substrates
  392. Structure investigations of nonpolar GaN layers
  393. High-Power 980-nm Broad-Area Lasers Spectrally Stabilized by Surface Bragg Gratings
  394. Enhancement of light extraction in ultraviolet light-emitting diodes using nanopixel contact design with Al reflector
  395. High-power distributed-feedback tapered master-oscillator power amplifiers emitting at 1064 nm
  396. High-power high-brightness semiconductor lasers based on novel waveguide concepts
  397. Comparison of 650 nm tapered lasers with different lateral geometries at output powers up to 1 W
  398. High-peak-power pulse generation with GHz repetition rate using a Q-switched 1060nm DBR tapered laser
  399. Temperature and excitation power dependent photoluminescence intensity of GaInN quantum wells with varying charge carrier wave function overlap
  400. Polarization of eigenmodes in laser diode waveguides on semipolar and nonpolar GaN
  401. Boule-like growth of GaN by HVPE
  402. Megahertz monocrystalline optomechanical resonators with minimal dissipation
  403. Compositional dependence of the bowing parameter for highly strained InGaAs/GaAs quantum wells
  404. Tapered lasers emitting at 650 nm with 1 W output power with nearly diffraction-limited beam quality
  405. Mode-locked InGaAs-AlGaAs disk laser generating sub-200-fs pulses, pulse picking and amplification by a tapered diode amplifier
  406. 190-fs semiconductor disk laser and tapered diode amplifier with ultrafast pulse picking
  407. 12.2 W output power from 1060 nm DBR tapered lasers with narrow spectral line width and nearly diffraction limited beam quality
  408. Limitations to peak continuous wave power in high power broad area single emitter 980 nm diode lasers
  409. High-power 808 nm ridge-waveguide diode lasers with very small divergence, wavelength-stabilized by an external volume Bragg grating
  410. Epitaxial lateral overgrowth on (21¯1¯0) a-plane GaN with [01¯11]-oriented stripes
  411. Strain engineering of AlGaN-GaN HFETs grown on 3 inch 4H-SiC
  412. Experimental method for scanning the surface depletion region in nitride based heterostructures
  413. HVPE growth of AlxGa1-xN alloy layers
  414. MOVPE growth for UV-LEDs
  415. 1060 nm DBR tapered lasers with 12 W output power and a nearly diffraction limited beam quality
  416. 4.5 W hybrid integrated master-oscillator power-amplifier at 976 nm on micro-optical bench
  417. MOVPE growth of InGaAs/GaAsP-MQWs for high-power laser diodes studied by reflectance anisotropy spectroscopy
  418. Twin-Contact 645-nm Tapered Laser With 500-mW Output Power
  419. Optimization of InGaN/(In,Al,Ga)N based near UV-LEDs by MQW strain balancing with in-situ wafer bow sensor
  420. Emission characteristics of InGaN multi quantum well light emitting diodes with differently strained InAlGaN barriers
  421. High-Brightness and Ultranarrow-Beam 850-nm GaAs/AlGaAs Photonic Band Crystal Lasers and Single-Mode Arrays
  422. High-Brightness Quantum Well Tapered Lasers
  423. High-Power DBR-Tapered Laser at 980 nm for Single-Path Second Harmonic Generation
  424. Sub-200-fs Passively Mode-Locked Semiconductor Disk Laser
  425. Ultrahigh-brightness 850 nm GaAs/AlGaAs photonic crystal laser diodes
  426. TEM study of c-plane GaN layers grown on γ-LiAlO2(100)
  427. In-situ etching of GaAs/AlxGa1−xAs by CBr4
  428. Growth parameter optimization of the GaInP/AlGaInP active zone of 635nm red laser diodes
  429. Semiconductor components for femtosecond semiconductor disk lasers grown by MOVPE
  430. Effect of the AIN nucleation layer growth on AlN material quality
  431. Conductively Cooled 637-nm InGaP Broad-Area Lasers and Laser Bars With Conversion Efficiencies Up to 37% and a Small Vertical Far Field of 30$^{\circ}$
  432. Influence of MOVPE growth temperature on the structural and optical properties of InGaN MQW laser diodes
  433. 5-W DBR Tapered Lasers Emitting at 1060 nm With a Narrow Spectral Linewidth and a Nearly Diffraction-Limited Beam Quality
  434. High brightness and ultra-narrow beam 850 nm GaAs/AlGaAs photonic band crystal lasers and first uncoupled PBC single-mode arrays
  435. High-power single-frequency operation of a DBR tapered laser
  436. Microscopic recombination kinetics in high quality, fully coalesced a-plane GaN ELO structures investigated by ps-time-resolved cathodoluminescence microscopy
  437. 2MeV ion irradiation effects on AlGaN/GaN HFET devices
  438. A-plane GaN epitaxial lateral overgrowth structures: Growth domains, morphological defects, and impurity incorporation directly imaged by cathodoluminescence microscopy
  439. Effect of the barrier composition on the polarization fields in near UV InGaN light emitting diodes
  440. Quantitative analysis of in situ wafer bowing measurements for III-nitride growth on sapphire
  441. Semipolar GaN grown on m-plane sapphire using MOVPE
  442. High-temperature growth of AlN in a production scale 11 × 2′ MOVPE reactor
  443. Passively mode-locked semiconductor disk laser generating sub-300-fs pulses
  444. Structural and optical properties of nonpolar GaN thin films
  445. 290-fs pulses from a semiconductor disk laser
  446. 5.6-W Broad-Area Lasers With a Vertical Far-Field Angle of 31$^{\circ}$ Emitting at 670 nm
  447. Microstructure of a-plane ( $$2\bar{1}\bar{1}0$$ ) GaN ELOG stripe patterns with different in-plane orientation
  448. Freestanding 2-in GaN layers using lateral overgrowth with HVPE
  449. High-Power Monolithic Two-Mode DFB Laser Diodes for the Generation of THz Radiation
  450. Integrated 1060nm MOPA pump source for high-power green light emitters in display technology
  451. 1 W reliable operation of broad area lasers and 8 W reliable operation of 5 mm wide laser bars at 650 nm
  452. GaN substrates by HVPE
  453. 650 nm tapered lasers with 1 W maximum output power and nearly diffraction limited beam quality at 500 mW
  454. High-brightness diode lasers with very narrow vertical divergence
  455. Irradiation effects on AlGaN HFET devices and GaN layers
  456. Fundamental-Lateral Mode Stabilized High-Power Ridge-Waveguide Lasers With a Low Beam Divergence
  457. Anisotropic strain on phonons in a-plane GaN layers studied by Raman scattering
  458. Near band edge and defect emissions from epitaxial lateral overgrown a-plane GaN with different stripe orientations
  459. 12 W high-brightness single-frequency DBR tapered diode laser
  460. Study of in-depth strain variation in ion-irradiated GaN
  461. High energy irradiation effects on AlGaN/GaN HFET devices
  462. Monolithic high brightness diode lasers: results and developments at FBH
  463. Influence of the barrier composition on the light output of InGaN multiple-quantum-well ultraviolet light emitting diodes
  464. X-ray diffraction spot mapping - a tool to study structural properties of semiconductor disk laser devices
  465. Mechanism of LiAlO2 decomposition during the GaN growth on (100) γ-LiAlO2
  466. Self-separation of thick two inch GaN layers grown by HVPE on sapphire using epitaxial lateral overgrowth with masks containing tungsten
  467. Optimization of HVPE growth of freestanding c-plane GaN layers using (100) γ-LiAlO2 substrates
  468. 5.5 W output power from 100 μm stripe width lasers at 670 nm with a vertical far-field angle of 32 degrees
  469. Optically pumped semiconductor disk laser with graded and step indices for cw and ultrashort pulse generation
  470. Fundamental-lateral mode stabilized high-power ridge-waveguide lasers
  471. High power monolithic two mode DFB laser diodes for the generation of terahertz radiation
  472. High power pulse generation from a 10mm long monolithic multi section mode locked semiconductor laser at 920nm
  473. High-power 980-nm monolithically integrated master-oscillator power-amplifier
  474. High-power hybrid integrated master-oscillator power-amplifier on micro-optical bench at 980-nm
  475. Five-hundred-milliwatts distributed-feedback diode laser emitting at 940nm
  476. Red luminescence from freestanding GaN grown on LiAlO2substrate by hydride vapor phase epitaxy
  477. 670 nm tapered lasers and amplifier with output powers P ⩾ 1 W and nearly diffraction limited beam quality
  478. Comprehensive study of (Al)GaAs Si-doping using reflectance anisotropy spectroscopy in metal-organic vapour-phase epitaxy
  479. 10 W continuous-wave monolithically integrated master-oscillator power-amplifier
  480. MOVPE growth optimization for laser diodes with highly strained InGaAs MQWs
  481. AlGaInP growth parameter optimisation during MOVPE for opto-electronic devices
  482. Segregation and desorption of antimony in InP (001) in MOVPE
  483. Growth optimization during III-nitride multiwafer MOVPE using real-time curvature, reflectance and true temperature measurements
  484. High-power red laser diodes grown by MOVPE
  485. 650-nm InGaP Broad Area Lasers With 5000-h Reliable Operation at 600 mW
  486. 3-W Broad Area Lasers and 12-W Bars With Conversion Efficiencies up to 40% at 650 nm
  487. Ultrashort pulse Yb:LaSc_3(BO_3)_4 mode-locked oscillator
  488. 9-W Output Power From an 808-nm Tapered Diode Laser in Pulse Mode Operation With Nearly Diffraction-Limited Beam Quality
  489. Proton and Heavy Ion Irradiation Effects on AlGaN/GaN HFET Devices
  490. Optically pumped semiconductor disk laser with graded and step indices
  491. Exciton resonance tuning for the generation of subpicosecond pulses from a mode-locked semiconductor disk laser
  492. 5-W Reliable Operation Over 2000 h of 5-mm-Wide 650-nm AlGaInP–GaInP–AlGaAs Laser Bars With Asymmetric Cladding Layers
  493. Feedback controlled growth of strain-balanced InGaAs multiple quantum wells in metal-organic vapour phase epitaxy using an in situ curvature sensor
  494. Freestanding two inch c-plane GaN layers grown on (100) γ-lithium aluminium oxide by hydride vapour phase epitaxy
  495. Bowing of thick GaN layers grown by HVPE using ELOG
  496. High and low energy proton irradiation effects on AlGaN/GaN HFETs
  497. N-type doping of HVPE-grown GaN using dichlorosilane
  498. Characterization of free standing GaN grown by HVPE on a LiAlO2substrate
  499. High power single mode 980nm DBR tapered diode lasers with integrated sixth order surface gratings based on simplified fabrication process
  500. Laser diodes with narrow vertical far firlds
  501. High-power 980-nm DFB RW lasers with a narrow vertical far field
  502. High-efficient 650 nm laser bars with an output power of about 10 W and a wall-plug efficiency of 30%
  503. High-power broad-area 808 nm DFB lasers for pumping solid state lasers
  504. High-power 808-nm tapered diode lasers with nearly diffraction-limited beam quality of M/sup 2/=1.9 at P=4.4 W
  505. In situ determination and control of AlGaInP composition during MOVPE growth
  506. Avoidance of surface-related defects in MOVPE-grown InGaP layers
  507. Optically pumped surface-emitting semiconductor disk lasers with high spatial and spectral homogeneity
  508. Passively mode-locked Yb:LuVO4oscillator
  509. 9 W Output Power from a 808 nm Tapered Diode Laser in Pulse Mode Operation with Nearly Diffraction-Limited Beam Quality
  510. Carrier dynamics in laterally strain-modulated InGaAs quantum wells
  511. Optical in-well pumping of a semiconductor disk laser with high optical efficiency
  512. 980-nm DBR lasers using higher order gratings defined by i-line lithography
  513. Mode-locked laser operation of epitaxially grown Yb:KLu(WO_4)_2 composites
  514. High-power high-efficiency 1150-nm quantum-well laser
  515. HigHighly strained InGaAs/GaAs quantum wells emitting beyond 1.2 µm
  516. Optimised two layer overgrowth of a lateral strain-modulated nanostructure
  517. Blue 489-nm picosecond pulses generated by intracavity frequency doubling in a passively mode-locked optically pumped semiconductor disk laser
  518. High-performance laser diodes with emission wavelengths above 1100 nm and very small vertical divergence of the far field
  519. Growth optimization for thick crack-free GaN layers on sapphire with HVPE
  520. High-power 808 nm lasers with a super-large optical cavity
  521. Growth of strained GaAsSb layers on GaAs (001) by MOVPE
  522. Reactor and growth process optimization for growth of thick GaN layers on sapphire substrates by HVPE
  523. High-power ridge-wavequide broad-area lasers with a DFB resonator in the wavelength range 760- to 790-nm
  524. Application of reflectance anisotropy spectroscopy to laser diode growth in MOVPE
  525. Comprehensive characterization of MOVPE-grown AlGaAs/AlAs distributed Bragg reflector structures by optical reflectance, X-ray diffraction and atomic force microscopy
  526. Passively cooled 940 nm laser bars with 73% wall-plug efficiency at 70 W and 25°C
  527. Passively mode-locked Yb:KLu(WO4)2 oscillators
  528. Design and realization of high-power DFB lasers
  529. Interdiffusion in highly strained InGaAs-QWs for high power laser diode applications
  530. Defect study of MOVPE-grown InGaP layers on GaAs
  531. Growth monitoring of GaAsSb:C/InP heterostructures with reflectance anisotropy spectroscopy
  532. Investigation of Breakdown and DC Behavior in HBTs With (Al,Ga)As Collector Layer
  533. Determination of band offsets in strainedInxGa1−xAs∕GaAsquantum wells by capacitance-voltage profiling and Schrödinger-Poisson self-consistent simulation
  534. Nonequilibrium carrier dynamics in heavily p-doped GaAs
  535. Interlayer formation due to group V-hydride stabilization during interruptions of MOVPE growth of InGaP
  536. Nanoengineering of lateral strain modulation in quantum well heterostructures
  537. In situ study of GaAs growth mechanisms using tri-methyl gallium and tri-ethyl gallium precursors in metal-organic vapour phase epitaxy
  538. Properties of As+-implanted and annealed GaAs and InGaAs quantum wells: Structural and band-structure modifications
  539. High-power 783 nm distributed-feedback laser
  540. Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE
  541. High-efficiency AlGaInP/AlGaAs vertical-cavity surface-emitting lasers with 650 nm wavelength
  542. In situ analysis of a vertical-cavity surface-emitting laser active layer by two-photon spectroscopy
  543. Highly strained very high-power laser diodes with InGaAs QWs
  544. MOVPE growth of visible vertical-cavity surface-emitting lasers (VCSELs)
  545. In-situ determination of interface roughness in MOVPE-grown visible VCSELs by reflectance spectroscopy
  546. Automated emissivity corrected wafer-temperature measurement in Aixtrons planetary reactors
  547. Preface
  548. Properties of (In,Ga)(As,P)/GaAs interfaces grown under different metalorganic vapor phase epitaxy conditions
  549. Influence of lateral patterning geometry on lateral carrier confinement in strain-modulated InGaAs-nanostructures
  550. Femtosecond excitation cavity studies and superluminescence by two-photon absorption in vertical cavity lasers at 300 K
  551. 650-nm vertical-cavity surface-emitting lasers: laser properties and reliability investigations
  552. High-power highly strained InGaAs quantum-well lasers operating at 1.2 μm
  553. Behavior of the Fermi-edge singularity in the photoluminescence spectra of a high-density two-dimensional electron gas
  554. Minority-carrier kinetics in heavily doped GaAs:C studied by transient photoluminescence
  555. Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE
  556. The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy
  557. MOVPE process development for 650nm VCSELS using optical in-situ techniques
  558. High-performance vertical-cavity surface-emitting lasers with emission wavelength between 650 and 670 nm
  559. In-situ Determination of the Carrier Concentration of (001) GaAs by Reflectance Anisotropy Spectroscopy
  560. Direct Growth of GaN on (0001) Sapphire by Low Pressure Hydride Vapour Phase Epitaxy
  561. Influence of oxygen in AlGaAs-based laser structures with Al-Free active region on device properties
  562. 12 W continuous-wave diode lasers at 1120 nm with InGaAs quantum wells
  563. Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy
  564. Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing
  565. Performance of 3-W/100-μm stripe diode laser at 950 and 810 nm
  566. Continuous-wave vertical-cavity surface-emitting lasers with emission wavelengths near 650 nm
  567. Investigation of strain-modulated InGaAs nanostructures by grazing-incidence x-ray diffraction and photoluminescence
  568. Recognition and imitation of pantomimed motor acts after unilateral parietal and premotor lesions: a perspective on apraxia
  569. (AlGa)As composition profile analysis of trenches overgrown with MOVPE
  570. High efficiency AlGaInP-based 650 nm vertical-cavity surface-emitting lasers
  571. High-power highly reliable Al-free 940-nm diode lasers
  572. High-power 810-nm GaAsP-AlGaAs diode lasers with narrow beam divergence
  573. Optimization of MOVPE growth for 650nm-emitting VCSELs
  574. Carbon doping for the GaAs base layer of Heterojunction Bipolar Transistors in a production scale MOVPE reactor
  575. Effect of growth conditions and strain compensation on indium incorporation for diode lasers emitting above 1050nm
  576. Comparison of binary and ternary growth over trenches using MOVPE
  577. MOVPE growth of (Al,Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy
  578. Al-free 950-nm BA diode lasers with high efficiency and reliability at 50° C ambient temperature
  579. Effect of high-temperature annealing on GaInP/GaAs HBT structures grown by LP-MOVPE
  580. MOVPE growth of AlGaAs/GaInP diode lasers
  581. Optimization of GaAsP/AlGaAs-based QW laser structures for high power 800 nm operation
  582. Modeling and experimental verification of transport and deposition behavior during MOVPE of Ga1-xInxP in the Planetary Reactor
  583. MOVPE growth of (Al, Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy
  584. Assessment of layer structures for GaInP/GaAs-heterojunction bipolar transistors
  585. Patterned growth of (AlGa)As using metalorganic vapor-phase epitaxy
  586. Correlation of InGaP(001) surface structure during growth and bulk ordering
  587. Diode lasers with Al-free quantum wells embedded in LOC AlGaAs waveguides between 715 nm and 840 nm
  588. High-power tensile-strained GaAsP-AlGaAs quantum-well lasers emitting between 715 and 790 nm
  589. MOVPE growth of tunable DBR laser diode emitting at 1060nm
  590. Ordering in GaxIn1−xAsyP1−y grown on GaAs by metalorganic vapour-phase epitaxy
  591. Analysis of Bragg reflectors by lateral photoluminescence spectroscopy
  592. Growth monitoring of GaInP/GaAs heterojunction bipolar transistors by reflectance anisotropy spectroscopy
  593. In situ monitoring and control of InGaP growth on GaAs in MOVPE
  594. Overgrowth of trenches with (AlGa)As using metalorganic vapor-phase epitaxy (MOVPE)
  595. Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques
  596. Photoluminescence on ordered GaxIn1−xAsyP1−y
  597. MOVPE growth of highly strained InGaAs/GaAs quantum wells
  598. Real-time growth monitoring of InGaAs/InP-HBT structures with reflectance anisotropy spectroscopy
  599. Formation of GaAsP interface layers monitored by reflectance anisotropy spectroscopy
  600. On-line growth monitoring of InP-based device structures by reflectance anisotropy spectroscopy
  601. Evaluation of strained InGaAs/GaAs quantum wells by atomic force microscopy
  602. High-resolution X-ray diffraction investigation of crystal perfection and relaxation of GaAs/InGaAs/GaAs quantum wells depending on MOVPE growth conditions
  603. Crystalline perfection in GaInAsP/GaAs laser structures with GaInP or AlGaAs cladding layers
  604. Assessment of compensation ratio in high-purity GaAs using photoluminescence
  605. Hydrogen in carbon-doped GaAs base layer of GaInP/GaAs heterojunction bipolar transistors
  606. Interdiffusion in InGaAs/GaAs and InGaAs/GaAsP quantum wells
  607. Influence of the growth temperature and substrate orientation on the layer properties of MOVPE-growth
  608. Stable operation of InGaAs/InGaP/AlGaAs ( = 1020 nm) laser diodes
  609. MOVPE growth of hetero-bipolar-transistors using CBr4 as carbon dopant source
  610. Growth monitoring by reflectance anisotropy spectroscopy in MOVPE reactors for device fabrication
  611. Heat transfer and mass transport in a multiwafer MOVPE reactor: modelling and experimental studies
  612. Introduction
  613. Temperature dependent EBIC and deep level transient spectroscopy investigation of different types of misfit-dislocations at MOVPE grown GaAs/InGaAs/GaAs-single-quantum wells
  614. Stability of sulfur-passivated facets of InGaAs-AlGaAs laser diodes
  615. Simple method for examining sulphur passivation of facets in InGaAs–AlGaAs (λ=0.98 μm) laser diodes
  616. High-power diode lasers based on InGaAsP spacer and waveguide layers with AlGaAs cladding layers
  617. Effect of growth temperature on performance of AIGaAs/lnGaAs/GaAs QW laser diodes
  618. In-plane photoluminescence of vertical cavity surface-emitting laser structures
  619. Carbon doped GaAs grown in low pressure-metalorganic vapor phase epitaxy using carbon tetrabromide
  620. Metalorganic vapor phase epitaxial growth of GaInAsP/GaAs
  621. A Comparison of the Growth of GaAs and GaP from Trimethyl-Gallium
  622. Effects of storage time of epi-ready InP:Fe substrates on the quality of metalorganic vapour phase epitaxial grown InP
  623. Transport and reaction behaviour in Aix-2000 planetary metalorganic vapour phase epitaxy reactor
  624. Potential sources of degradation in InGaAs/GaAs laser diodes
  625. Effect of growth interruption on performance of AlGaAs/InGaAs/GaAs quantum well lasers
  626. Modelling of growth in a 5 X 3 inch multiwafer metalorganic vapour phase epitaxy reactor
  627. Growth of GaAsN alloys by low‐pressure metalorganic chemical vapor deposition using plasma‐cracked NH3
  628. Surface chemistry of new As precursors for MOVPE and MOMBE: phenylarsine and tertiarybutylarsine on GaAs(100)
  629. Localized deposition of In and Ga in MOMBRE
  630. Carbon in III-V Compounds: A Theoretical Approach
  631. Red Shift of Photoluminescence and Absorption in Dilute GaAsN Alloy Layers
  632. Growth of GaP by MOVPE at very low pressure: kinetics and carbon incorporation
  633. Adsorption and Decomposition of Organometallics on GaAs Surfaces in Low-Pressure Metalorganic Chemical Vapor Deposition
  634. Epitaxy of III–V semiconductors
  635. Composition of selectively grown InxGa1−xAs structures from locally resolved Raman spectroscopy
  636. Surface chemistry of a new III–V MOCVD reactant: PhAsH2 on GaAs(100)
  637. Correlation of carbon incorporation from TEG and effective V/III ratio on the surface in MOMBE grown GaAs
  638. Doping of GaAs and InP in MOMBE using DEZn, TESn and DETe
  639. New starting materials for MOMBE
  640. Gaseous dopant sources in MOMBE/CBE
  641. MOMBE of InAs on GaAs
  642. Substituted arsines as As sources in MOMBE
  643. Effect of doping on the thermal oxidation of GaAs
  644. Effect of impurities on the thermal oxidation process in InP
  645. Residual donor contamination in MOCVD, MOMBE and MBE GaAs studied by far-infrared spectroscopy
  646. Carbon incorporation in MOMBE-grown Ga0.47In0.53As
  647. Mombe and Pemocvd Growth of GaAs on Si (100) Substrates
  648. MOMBE and MOVPE—A comparison of growth techniques
  649. Quantitative analysis of carbon concentration in MOMBEp‐GaAs by low‐temperature photoluminescence
  650. Arsenic passivation of MOMBE grown GaAs surfaces
  651. Defects in GaAs films grown by MOMBE
  652. Doping of GaAs in metalorganic MBE using gaseous sources
  653. Selective growth of GaAs in the MOMBE and MOCVD systems
  654. Intentional ρ-type doping by carbon in metalorganic MBE of GaAs
  655. A comparative study of Ga(CH3)3 and Ga(C2H5)3 in the mombe of GaAs
  656. Epitaxy of High-Power Diode Laser Structures
  657. High-power, high-efficiency 1150 nm quantum well laser
  658. High power 810 nm GaAsP/AlGaAs diode lasers with narrow beam divergence
  659. Femtosecond mode-locking of epitaxially grown Yb:KLu(WO/sub 4/)/sub 2/ composites
  660. Passively cooled 940 nm laser bars with 73 % wall-plug efficiency and high reliability at 98 W quasi-cw output power
  661. Sub-80 fs pulses from a mode-locked Yb:NaGd(WO/sub 4/)/sub 2/ laser
  662. Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE
  663. Red VCSELs: More than 4 mW output power at 650 nm
  664. 5.3 W CW high brightness 980-nm tapered diode lasers
  665. 980-nm DBR lasers using higher order gratings fabricated in a single-step process
  666. High-power 980-nm DFB diode lasers with a small vertical farfield divergence
  667. Development of 650 nm-emitting VCSELs for cw operation
  668. High power, highly reliable Al-free 940 nm diode lasers
  669. Real-time monitoring of P-based semiconductor growth by linear-optical spectroscopy
  670. MOVPE-overgrowth for buried InP/(In,Ga)(As,P) laser diode arrays