Publication not explained

This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.

If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.

Featured Image

Read the Original

This page is a summary of: Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE, Journal of Crystal Growth, April 2002, Elsevier,
DOI: 10.1016/s0022-0248(02)00910-7.
You can read the full text:

Read

Contributors

The following have contributed to this page