Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V Favre-Nicolin, F Mastropietro, J Eymery, D Camacho, Y M Niquet, B M Borg, M E Messing, L-E Wernersson, R E Algra, E P A M Bakkers, T H Metzger, R Harder, I K Robinson
  • New Journal of Physics, March 2010, Institute of Physics Publishing
  • DOI: 10.1088/1367-2630/12/3/035013

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http://dx.doi.org/10.1088/1367-2630/12/3/035013

The following have contributed to this page: Dr Vincent Favre-Nicolin, Dr Joel Eymery, and Mattias Borg