All Stories

  1. A study on the improvements and limitations of image quality in quantum polarization microscopy using an entangled-photon source
  2. Demonstration of Quantum Polarized Microscopy Using an Entangled-Photon Source
  3. Thermoelectric measurements of nanomaterials by nanodiamond quantum thermometry
  4. The Influence of Oxygen‐Related Defects on the Formation of In2O3‐Based Low‐Fluorescence Transparent Conducting Film
  5. Optically detected magnetic resonance of silicon vacancies in 4H-SiC at elevated temperatures toward magnetic sensing under harsh environments
  6. Impact of formation process on the radiation properties of single-photon sources generated on SiC crystal surfaces
  7. Influences of hydrogen ion irradiation on NcVsi − formation in 4H-silicon carbide
  8. Carrier dynamics of silicon vacancies of SiC under simultaneous optically and electrically excitations
  9. Influence of neutron radiation on majority and minority carrier traps in n-type 4H-SiC
  10. Effects of Nitrogen Impurity Concentration on Nitrogen-Vacancy Center Formation in 4H-SiC
  11. Enhancement of ODMR Contrasts of Silicon Vacancy in SiC by Thermal Treatment
  12. Near Infrared Photoluminescence of N<sub>C</sub>V<sub>Si</sub><sup>-</sup> Centers in High-Purity Semi-Insulating 4H-SiC Irradiated with Energetic Charged Particles
  13. Optically Detected Magnetic Resonance Study of 3D Arrayed Silicon Vacancies in SiC pn Diodes
  14. Formation of nitrogen-vacancy centers in 4H-SiC and their near infrared photoluminescence properties
  15. Radiation Response of Negative Gate Biased SiC MOSFETs
  16. Creation of Color Centers in SiC PN Diodes Using Proton Beam Writing
  17. Macroscopic simulations of the SiC thermal oxidation process based on the Si and C emission model
  18. First-principles study of oxygen-related defects on 4H-SiC surface: The effects of surface amorphous structure
  19. Oxygen-incorporated single-photon sources observed at the surface of silicon carbide crystals
  20. Electrically controllable position-controlled color centers created in SiC pn junction diode by proton beam writing
  21. Various Single Photon Sources Observed in SiC Pin Diodes
  22. Room Temperature Electrical Control of Single Photon Sources at 4H-SiC Surface
  23. Generation of stacking faults in 4H-SiC epilayer induced by oxidation
  24. Silicon vacancy creation in SiC by proton beam writing
  25. Three-Dimensional Proton Beam Writing of Optically Active Coherent Vacancy Spins in Silicon Carbide
  26. Optimum structures for gamma-ray radiation resistant SiC-MOSFETs
  27. Impacts of gate bias and its variation on gamma-ray irradiation resistance of SiC MOSFETs
  28. Effect of gamma-ray irradiation on the device process-induced defects in 4H-SiC epilayers
  29. Improvement of radiation response of SiC MOSFETs under high temperature and humidity conditions
  30. Unified theory of silicon carbide oxidation based on the Si and C emission model
  31. WBD power device engineer
  32. Gamma-Ray Irradiation Response of the Motor-Driver Circuit with SiC MOSFETs
  33. Photoluminescence study of oxidation-induced faults in 4H-SiC epilayers
  34. Radiation response of silicon carbide metal–oxide–semiconductor transistors in high dose region
  35. Molecular beam epitaxial growth of intermediate-band materials based on GaAs:N δ-doped superlattices
  36. Control of intermediate-band configuration in GaAs:N δ-doped superlattice
  37. Photoluminescence Study of Oxidation-Induced Stacking Faults in 4H-SiC Epilayers
  38. Surface Orientation Dependence of SiC Oxidation Process Studied by In Situ Spectroscopic Ellipsometry
  39. Recovery of the Electrical Characteristics of SiC MOSFETs Irradiated with Gamma-Rays by Thermal Treatments
  40. Si and C emission into the oxide layer during the oxidation of silicon carbide and its influence on the oxidation rate
  41. Growth temperature dependence of the surface segregation of Er atoms in GaAs during molecular beam epitaxy
  42. Differences in SiC thermal oxidation process between crystalline surface orientations observed by in-situ spectroscopic ellipsometry
  43. Enhanced optical absorption due to E + -related band transition in GaAs:N δ-doped superlattices
  44. Photoreflectance study of the temperature dependence of excitonic transitions in dilute GaAsN alloys
  45. Si Emission into the Oxide Layer during Oxidation of Silicon Carbide
  46. Analysis of Electronic Structures of Nitrogen δ-Doped GaAs Superlattices for High Efficiency Intermediate Band Solar Cells
  47. Conversion Efficiency of Intermediate Band Solar Cells with GaAs:N δ-Doped Superlattices
  48. Stacked structure of self-organized cubic InN nano-dots grown by molecular beam epitaxy
  49. Molecular beam epitaxy of ErGaAs alloys on GaAs (001) substrates
  50. RF-MBE growth of cubic InN nano-scale dots on cubic GaN
  51. Optical absorption by E+ miniband of GaAs:N δ-doped superlattices
  52. Biexciton emission from single isoelectronic traps formed by nitrogen-nitrogen pairs in GaAs
  53. Model Calculations of SiC Oxide Growth Rates at Sub-Atmospheric Pressures Using the Si and C Emission Model
  54. Biexciton Luminescence from Individual Isoelectronic Traps in Nitrogen $\delta$-Doped GaAs
  55. Nondestructive and Contactless Characterization Method for Spatial Mapping of the Thickness and Electrical Properties in Homo-Epitaxially Grown SiC Epilayers Using Infrared Reflectance Spectroscopy
  56. Physics and Technology of Silicon Carbide Devices
  57. Thermal Oxidation Mechanism of Silicon Carbide
  58. Oxygen partial pressure dependence of the SiC oxidation process studied by in-situ spectroscopic ellipsometry
  59. Analysis of the energy structure of nitrogen δ-doped GaAs superlattices for high efficiency intermediate band solar cells
  60. Micro-Photoluminescence Study on the Influence of Oxidation on Stacking Faults in 4H-SiC Epilayers
  61. RF-MBE growth of semipolar InN(10-13) and InGaN(10-13) on GaAs(110)
  62. Single Photon Generation from Nitrogen Atomic-Layer Doped Gallium Arsenide
  63. Quantum well double barrier resonant tunneling structures for selective contacts of hot carrier solar cells
  64. Growth Rate Enhancement of Silicon-Carbide Oxidation in Thin Oxide Regime
  65. Theoretical Studies for Si and C Emission into SiC Layer during Oxidation
  66. High Cubic-Phase Purity InN on MgO (001) Using Cubic-Phase GaN as a Buffer Layer
  67. Photoluminescence from single isoelectronic traps in nitrogen delta-doped GaAs grown on GaAs(111)A
  68. RF-MBE growth of InN on 4H-SiC (0001) with off-angles
  69. In Situ Spectroscopic Ellipsometry Study of SiC Oxidation at Low Oxygen-Partial-Pressures
  70. Model Calculations of SiC Oxide Growth Rate at Various Oxidation Temperatures Based on the Silicon and Carbon Emission Model
  71. Optical and electrical characterizations of 4H-SiC–oxide interfaces by spectroscopic ellipsometry and capacitance–voltage measurements
  72. Model Calculation of SiC Oxide Growth Rate Based on the Silicon and Carbon Emission Model
  73. Observation of SiC Oxidation in Ultra-Thin Oxide Regime by In Situ Spectroscopic Ellipsometry
  74. Characterization of 4H-SiC–SiO2 Interfaces by a Deep Ultraviolet Spectroscopic Ellipsometer
  75. A Kinetic Model of Silicon Carbide Oxidation Based on the Interfacial Silicon and Carbon Emission Phenomenon
  76. Oxide Growth Rate Enhancement of Silicon Carbide (0001) Si-Faces in Thin Oxide Regime
  77. Improvement of the surface morphology ofa -plane InN using low-temperature InN buffer layers
  78. Photoluminescence of cubic InN films on MgO (001) substrates
  79. Photoluminescence study of hexagonal InN/InGaN quantum well structures grown on 3C-SiC (001) substrates by molecular beam epitaxy
  80. Twin photoluminescence peaks from single isoelectronic traps in nitrogen δ-doped GaAs
  81. MOS capacitors obtained by wet oxidation of n-type 4H–SiC pre-implanted with nitrogen
  82. Characterization of MOS Capacitors Fabricated on n-type 4H-SiC Implanted with Nitrogen at High Dose
  83. Fabrication of MOS Capacitors by Wet Oxidation of p-Type 4H-SiC Preamorphized by Nitrogen Ion Implantation
  84. Simultaneous Determination of the Carrier Concentration, Mobility and Thickness of SiC Homo-Epilayers Using Terahertz Reflectance Spectroscopy
  85. Growth Rate Enhancement of (000\bar1)-Face Silicon–Carbide Oxidation in Thin Oxide Regime
  86. Photoluminescence study of isoelectronic traps in dilute GaAsN alloys
  87. RF-MBE growth of InN/InGaN quantum well structures on 3C–SiC substrates
  88. RF-MBE growth of a-plane InN on r-plane sapphire with a GaN underlayer
  89. Micro-Raman study on the improvement of luminescence efficiency of GaAsN alloys
  90. Micro-photoluminescence study of nitrogen delta-doped GaAs grown by metalorganic vapor phase epitaxy
  91. Simultaneous Determination of Carrier Concentration, Mobility, and Thickness of SiC Homoepilayers by Infrared Reflectance Spectroscopy
  92. Characterization of oxide films on 4H-SiC epitaxial (0001¯) faces by high-energy-resolution photoemission spectroscopy: Comparison between wet and dry oxidation
  93. Photo-induced improvement of radiative efficiency and structural changes in GaAsN alloys
  94. RF-MBE growth of cubic InN films on MgO (001) substrates
  95. Growth of high-quality hexagonal InN on 3C-SiC (001) by molecular beam epitaxy
  96. Effect of Ar post-oxidation annealing on oxide–4H-SiC interfaces studied by capacitance to voltage measurements and photoemission spectroscopy
  97. Epitaxial growth of hexagonal and cubic InN films
  98. Characterization of Carrier Concentration and Mobility in n-type SiC Wafers Using Infrared Reflectance Spectroscopy
  99. Improvement in the luminescence efficiency of GaAsN alloys by photoexcitation
  100. Spectroscopic ellipsometry study on the dielectric functions of GaPN alloys
  101. Characterization of the Interfaces between SiC and Oxide Films by Spectroscopic Ellipsometry
  102. The Investigation of 4H-SiC/SiO2 Interfaces by Optical and Electrical Measurements
  103. X-Ray Photoelectron Spectroscopy Studies of Post-Oxidation Process Effects on Oxide/SiC Interfaces
  104. Measurements of the Depth Profile of the Refractive Indices in Oxide Films on SiC by Spectroscopic Ellipsometry
  105. Composition analysis of SiO2/SiC interfaces by electron spectroscopic measurements using slope-shaped oxide films
  106. Photoluminescence Study on Temperature Dependence of Band Gap Energy of GaAsN Alloys
  107. Spectroscopic Ellipsometry Study on the Electronic Structure near the Absorption Edge of GaAsN Alloys
  108. Characterization of Oxide Films on SiC by Spectroscopic Ellipsometry
  109. Pressure Sensitivity of a Fiber-Optic Microprobe for High-Frequency Ultrasonic Field