All Stories

  1. Odyssey of the charge pumping technique and its applications from micrometric- to atomic-scale era

    Article • Journal of Applied Physics, December 2023, American Institute of Physics

    Dr. Boualem Djezzar

  2. On Transistor Sizing of CMOS 6T-SRAM for NBTI-aware Design

    Article • IET Circuits Devices & Systems, February 2020, the Institution of Engineering and Technology (the IET)

    Pr Hamid Bentarzi, Dr. Boualem Djezzar, Amel Chenouf, Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability Boualem Djezzar