Recent applications of SEM and AFM for assessing topography of metal and related coatings — a review

J R Smith, C Larson, S A Campbell
  • Transactions of the IMF, January 2011, Taylor & Francis
  • DOI: 10.1179/174591910x12922367327388

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http://dx.doi.org/10.1179/174591910x12922367327388

The following have contributed to this page: Dr James R Smith