XTOP: high-resolution X-ray diffraction and imaging

Vincent Favre-Nicolin, José Baruchel, Hubert Renevier, Joël Eymery, András Borbély
  • Journal of Applied Crystallography, May 2015, International Union of Crystallography
  • DOI: 10.1107/s160057671500895x

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The following have contributed to this page: Dr Vincent Favre-Nicolin and Dr Joel Eymery