Time-Dependent Relaxation of Strained Silicon-on-Insulator Lines Using a Partially Coherent X-Ray Nanobeam

F. Mastropietro, J. Eymery, G. Carbone, S. Baudot, F. Andrieu, V. Favre-Nicolin
  • Physical Review Letters, November 2013, American Physical Society (APS)
  • DOI: 10.1103/physrevlett.111.215502

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http://dx.doi.org/10.1103/physrevlett.111.215502

The following have contributed to this page: Dr Vincent Favre-Nicolin and Dr Joel Eymery