Metrics for crystallographic diffraction- and fit-data: a review of existing ones and the need for new ones

J. Henn
  • Crystallography Reviews, April 2019, Taylor & Francis
  • DOI: 10.1080/0889311x.2019.1607845

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

The following have contributed to this page: Julian Henn