X-ray measurements of the strain and shape of dielectric/metallic wrap-gated InAs nanowires

J. Eymery, V. Favre-Nicolin, L. Fröberg, L. Samuelson
  • Applied Physics Letters, March 2009, American Institute of Physics
  • DOI: 10.1063/1.3114369

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http://dx.doi.org/10.1063/1.3114369

The following have contributed to this page: Dr Vincent Favre-Nicolin and Dr Joel Eymery