Strain and Shape of Epitaxial InAs/InP Nanowire Superlattice Measured by Grazing Incidence X-ray Techniques

Joël Eymery, François Rieutord, Vincent Favre-Nicolin, Odile Robach, Yann-Michel Niquet, Linus Fröberg, Thomas Mårtensson, Lars Samuelson
  • Nano Letters, September 2007, American Chemical Society (ACS)
  • DOI: 10.1021/nl070888q

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http://dx.doi.org/10.1021/nl070888q

The following have contributed to this page: Dr Vincent Favre-Nicolin and Dr Joel Eymery