All Stories

  1. Deposition of ternary hafnium aluminum oxide alloy thin films via single-source mist chemical vapor deposition
  2. Low interface state density in Al2O3/n-GaN MOS capacitors with rapid deposition of Al2O3 gate insulator fabricated via mist-CVD
  3. Interface state density in mist chemical vapor deposited Al2O3/AlGaN/GaN structure
  4. Mist chemical vapor deposited-gate insulators for GaN-based MIS devices applications
  5. Evidence of reduced interface states in Al2O3/AlGaN MIS structures via insertion of ex situ regrown AlGaN layer
  6. Electrical properties of GaN-based MIS-HEMTs with Al2O3 gate insulator deposited by ALD and mist-CVD techniques
  7. Recessed gate GaN-based MIS-HEMTs with Al2O3 gate dielectric deposited by mist-CVD method
  8. Mist chemical vapor deposited-Al2O3/AlGaN interfacial characterization for GaN MIS-HEMTs
  9. Ornstein–Uhlenbeck process in a human body weight fluctuation
  10. Controlling surface/interface states in GaN-based transistors: Surface model, insulated gate, and surface passivation
  11. GaN-based MIS-HEMTs with Al2O3 dielectric deposited by low-cost and environmental-friendly mist-CVD technique
  12. Inverse integral transformation method to derive local viscosity distribution measured by optical tweezers
  13. Structural characterization of mist chemical vapor deposited amorphous aluminum oxide films using water-free solvent
  14. On the presence of Ga2O sub-oxide in high-pressure water vapor annealed AlGaN surface by combined XPS and first-principles methods
  15. Synthesis and characterization of mist chemical vapor deposited aluminum titanium oxide films
  16. Characterization of amorphous aluminium oxide thin films synthesized by mist-CVD
  17. Effect of Buffer Layer on Improvement of SnO2 Thin Film on Sapphire Substrate Formed by Mist Chemical Vapor Deposition
  18. Synthesis and characterization of AlTiO films by mist-CVD
  19. Improved linearity, stability, and thermal performance of multi-mesa-channel AlGaN/GaN HEMTs
  20. Structural characteristics of a non-polar ZnS layer on a ZnO buffer layer formed on a sapphire substrate by mist chemical vapor deposition
  21. State of the art on gate insulation and surface passivation for GaN-based power HEMTs
  22. Analytical derivation of charge relaxation time distribution in transistor from current noise spectrum using inverse integral transformation method
  23. Epitaxial Growth of Non-polar ZnS on Sapphire Substrate by Mist Chemical Vapor Deposition
  24. Influence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2by atomic layer deposition: leakage current and density of states reduction
  25. Improvement of m -plane ZnO films formed on buffer layers on sapphire substrates by mist chemical vapor deposition
  26. On the origin of interface states at oxide/III-nitride heterojunction interfaces
  27. Single crystalline SnO2 thin films grown on m -plane sapphire substrate by mist chemical vapor deposition
  28. Highly-stable and low-state-density Al2O3/GaN interfaces using epitaxial n-GaN layers grown on free-standing GaN substrates
  29. Effects of Electronic States at Insulator/AlGaN Interfaces on Threshold Voltage Instability of Al2O3/AlGaN/GaN Structures
  30. Insulated gate and surface passivation structures for GaN-based power transistors
  31. Improvement of m-plane ZnO films formed on buffer layers on sapphire substrates by mist chemical vapor deposition
  32. SnO2 thin films grown on m-plane sapphire substrate by mist chemical vapor deposition
  33. Characterization of capture cross sections of interface states in dielectric/III-nitride heterojunction structures
  34. Formation of GaN porous structures with improved structural controllability by photoassisted electrochemical etching
  35. Impact of oxygen plasma treatment on the dynamic on-resistance of AlGaN/GaN high-electron-mobility transistors
  36. Bias-dependent Photoabsorption Properties of GaN Porous Structures under Back-side Illumination
  37. Large photocurrents in GaN porous structures with a redshift of the photoabsorption edge
  38. Formation of Self-aligned Pore Arrays on n-GaN Substrates by Photo-assisted Electrochemical Etching Process
  39. Current Collapse Reduction in AlGaN/GaN HEMTs by High-Pressure Water Vapor Annealing
  40. Formation of GaN-Porous Structures Using Photo-Assisted Electrochemical Process in Back-Side Illumination Mode
  41. Calculating relaxation time distribution function from power spectrum based on inverse integral transformation method
  42. Interface trap states in Al2O3/AlGaN/GaN structure induced by inductively coupled plasma etching of AlGaN surfaces
  43. Characterization of electronic states at insulator/(Al)GaN interfaces for improved insulated gate and surface passivation structures of GaN-based transistors
  44. Reduced thermal resistance in AlGaN/GaN multi-mesa-channel high electron mobility transistors
  45. Correlation between Structural and Photoelectrochemical Properties of GaN Porous Nanostructures Formed by Photo-Assisted Electrochemical Etching
  46. Interface Characterization and Control of GaN-based Heterostructures
  47. Characterization of interface states in Al2O3/AlGaN/GaN structures for improved performance of high-electron-mobility transistors
  48. Investigation on optical absorption properties of electrochemically formed porous InP using photoelectric conversion devices
  49. Formation and Photoelectrical Measurements of Pt Schottky Interfaces on InP Porous Structures
  50. Effects of Cl2-Based Inductively Coupled Plasma Etching of AlGaN on Interface Properties of Al2O3/AlGaN/GaN Heterostructures
  51. Interface characterization of Al2O3/AlGaN/GaN structure with inductively coupled plasma etching of AlGaN surface
  52. Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiN$_{x}$ Gate Insulator
  53. Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiNxGate Insulator
  54. Large photocurrent-response observed at Pt/InP Schottky interface formed on anodic porous structure
  55. Contraction behaviors of Vorticella sp. stalk investigated using high-speed video camera. I: Nucleation and growth model
  56. Contraction behaviors of Vorticella sp. stalk investigated using high-speed video camera. II: Viscosity effect of several types of polymer additives
  57. Optical Absorption Properties of InP Porous Structures Formed by Electrochemical Process
  58. Image analysis of thickness in flowing soap films. I: effects of polymer
  59. 3P215 Complex Chemical Physics XXXVIII : The lamellar - vesicle transition of Multilamellar Vesicle in sine oscillatory shear flow(Cell biology,The 48th Annual Meeting of the Biophysical Society of Japan)
  60. Size evolution of onion structure under oscillatory shear flow
  61. 2P-161 Study on Bio-Probe in Polymer Solutions(Cell biology,The 47th Annual Meeting of the Biophysical Society of Japan)
  62. 3P-145 Contraction process of Vorticella stalk measured by high-speed camera(Cell bioiogy,The 47th Annual Meeting of the Biophysical Society of Japan)
  63. 3P-147 Construction of game's relationship theory using five white-rot fungi(Cell bioiogy,The 47th Annual Meeting of the Biophysical Society of Japan)
  64. Formation process of shear-induced onion structure made of quaternary system SDS/octanol/water/NaCl
  65. Fluorescence lifetime imaging microscopy for in situ observation of the nanocrystallization of rubrene in a microfluidic set-up