All Stories

  1. Computational Analysis of the Effects of Nanoscale Confinement on the Structure of Low-k Dielectric Hybrid Organosilicate Materials
  2. Florets for Chiplets for running Datacenter scale CNNs concurrently
  3. Quantum Logic Locking for Security
  4. SCANN: Side Channel Analysis of Spiking Neural Networks
  5. Quantum Machine Learning for Ocular Disease Recognition
  6. ObfusX: Routing obfuscation with explanatory analysis of a machine learning attack
  7. Exploring Topological Semi-Metals for Interconnects
  8. When a Quantum Scientist Interviews ChatGPT
  9. Quantum Logic Locking for Security
  10. Quantum Machine Learning for Material Synthesis and Hardware Security (Invited Paper)
  11. Optimization of Quantum Read-Only Memory Circuits
  12. A Shuttle-Efficient Qubit Mapper for Trapped-Ion Quantum Computers
  13. Muzzle the Shuttle: Efficient Compilation for Multi-Trap Trapped-Ion Quantum Computers
  14. Shuttle-Exploiting Attacks and Their Defenses in Trapped-Ion Quantum Computers
  15. Quantum-Classical Hybrid Machine Learning for Image Classification (ICCAD Special Session Paper)
  16. Sampling-Based Approximate Logic Synthesis: An Explainable Machine Learning Approach
  17. Split Compilation for Security of Quantum Circuits
  18. Lorax: Machine Learning-Based Oracle Reconstruction With Minimal I/O Patterns
  19. Quantum PUF for Security and Trust in Quantum Computing
  20. A Survey and Tutorial on Security and Resilience of Quantum Computing
  21. Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization
  22. ObfusX
  23. Quantum Generative Models for Small Molecule Drug Discovery
  24. Explainable DRC Hotspot Prediction with Random Forest and SHAP Tree Explainer
  25. Beyond-CMOS Technologies for Next Generation Computer Design
  26. Editorial for TODAES Special Issue on Internet of Things System Performance, Reliability, and Security
  27. MapReduce-based pattern classification for design space analysis
  28. Editorial for JETC Special Issue on Alternative Computing Systems
  29. Identification and sensitivity analysis of a correlated ground rule system (design arc)
  30. ICCAD-2016 CAD contest in pattern classification for integrated circuit design space analysis and benchmark suite
  31. E-beam inspection throughput acceleration via Targeted Critical Area Inspection
  32. More than Moore Technologies for Next Generation Computer Design
  33. Design and technology co-optimization near single-digit nodes
  34. ICCAD-2014 CAD contest in design for manufacturability flow for advanced semiconductor nodes and benchmark suite
  35. Guest Editorial: Special Section on Optical Interconnects
  36. Design with FinFETs: Design rules, patterns, and variability
  37. Chip-scale physical interconnect models (Tutorial)
  38. Welcome to ISQED 2013
  39. Guest Editors' Introduction to Practical Parallel EDA
  40. Efficient multi-die placement for blank defect mitigation in EUV lithography
  41. Recent Topics on Modeling of Semiconductor Processes, Devices and Circuits
  42. Characterization and decomposition of self-aligned quadruple patterning friendly layout
  43. Block-level 3D IC design with through-silicon-via planning
  44. TSV density-driven global placement for 3D stacked ICs
  45. GPU programming for EDA with OpenCL
  46. Hot spot detection for indecomposable self-aligned double patterning layout
  47. EUV mask preparation considering blank defects mitigation
  48. Effective decomposition algorithm for self-aligned double patterning lithography
  49. Timing variability analysis for layout-dependent-effects in 28nm custom and standard cell-based designs
  50. Is manufacturability with double patterning a burden on designer? Analyses of device and circuit aspects
  51. Device and circuit implications of double-patterning — A designer's perspective
  52. Fast variational static IR-drop analysis on the graphical processing unit
  53. Self-aligned double patterning decomposition for overlay minimization and hot spot detection
  54. Applications driving 3D integration and corresponding manufacturing challenges
  55. Test structures to quantify contact placement-impacted drain current variations
  56. SIS wide-band model extraction methodology for SOI on-chip inductor
  57. Assessing chip-level impact of double patterning lithography
  58. 3-2-1 contact
  59. Is overlay error more important than interconnect variations in double patterning?
  60. CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design
  61. Chip Optimization Through STI-Stress-Aware Placement Perturbations and Fill Insertion
  62. Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics
  63. DOE-Based Extraction of CMP, Active and Via Fill Impact on Capacitances
  64. Exploiting STI stress for performance
  65. A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances
  66. Energy-Minimization Model for Fill Synthesis
  67. Process Variation-Aware Multiple-Fault Diagnosis of Thermometer-Coded Current-Steering DACs
  68. Standard Cell and Custom Circuit Optimization using Dummy Diffusions through STI Width Stress Effect Utilization
  69. Interconnect Matching Design Rule Inferring and Optimization through Correlation Extraction
  70. Novel multiple function analog filter structures and a dual-mode multifunction filter
  71. Generation of design guarantees for interconnect matching
  72. Statistical Compact Modeling and Si Verification Methodology
  73. A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs
  74. Forward discrete probability propagation method for device performance characterization under process variations
  75. New current–mode special function continuous-time active filters employing only OTAs and OPAMPs
  76. Current-input Current-output Notch and Bandpass Analog Filter Structures as Alternatives to Active-R Circuits
  77. Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations
  78. High-Performance Computing for Theoretical Study of Nanoscale and Molecular Interconnects
  79. Monte Carlo-Alternative Probabilistic Simulations for Analog Systems
  80. On mismatch in the deep sub-micron era-from physics to circuits