All Stories

  1. CeConP: Exploring Node Centrality for Early Routing Congestion Prediction

    Article • February 2024, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  2. Fast and Low-Error Prediction of Logic Gate Cell Characterization

    Article • December 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  3. New Modified 4:2 Approximate Compressors for Low-Power Applications

    Article • August 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  4. A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures

    Article • August 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  5. Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation

    Article • May 2023, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  6. Adaptive Batch Size CGP: Improving Accuracy and Runtime for CGP Logic Optimization Flow

    Article • January 2023, Springer Science + Business Media

    Cristina Meinhardt

  7. Review of Machine Learning in Logic Synthesis

    Article • Journal of Integrated Circuits and Systems, December 2022, Journal of Integrated Circuits and Systems

    Cristina Meinhardt

  8. Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology

    Article • Integration, November 2022, Elsevier

    Cristina Meinhardt

  9. Optimizing machine learning logic circuits with constant signal propagation

    Article • Integration, November 2022, Elsevier

    Cristina Meinhardt

  10. E-RVP: An Initial Design Rule Violation Predictor Using Placement Information

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  11. Approximation Workflow for Energy-Efficient Comparators in Decision Tree Applications

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  12. Exploring Approximate Comparator Circuits on Power Efficient Design of Decision Trees

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  13. Exploring Approximate Computing Approaches to Design Power-efficient Multipliers

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  14. Routability-Driven Detailed Placement Using Reinforcement Learning

    Article • October 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  15. Exploring Machine Learning for Electrical Behavior Prediction: The CMOS Inverter Case Study

    Article • August 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  16. Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing

    Article • August 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  17. A Decision Tree Synthesis Flow for Precise and Approximate Circuits

    Article • June 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  18. CGP-based Logic Flow: Optimizing Accuracy and Size of Approximate Circuits

    Article • Journal of Integrated Circuits and Systems, April 2022, Journal of Integrated Circuits and Systems

    Cristina Meinhardt

  19. An architecture proposal for checkpoint/restore on stateful containers

    Article • April 2022, ACM (Association for Computing Machinery)

    Cristina Meinhardt

  20. Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing

    Article • IEEE Design and Test, April 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  21. Exploring the Impacts of Multiple Kernel Sizes of Gaussian Filters Combined to Approximate Computing in Canny Edge Detection

    Article • March 2022, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  22. Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  23. SET Mitigation Techniques on Mirror Full Adder at 7 nm FinFET Technology

    Article • October 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  24. Accuracy and Size Trade-off of a Cartesian Genetic Programming Flow for Logic Optimization

    Article • August 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  25. Exploring Approximate Computing and Near- Threshold Operation to Design Energy -efficient Multipliers

    Article • August 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  26. Exploring Constant Signal Propagation to Optimize Neural Network Circuits

    Article • August 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  27. A Multi-Agent-Based Network-on-Chip Simulator

    Article • Journal of Integrated Circuits and Systems, August 2021, Journal of Integrated Circuits and Systems

    Cristina Meinhardt, Diana Adamatti

  28. FinFET Inverter Designs: Behavior and Challenges of Process Variability

    Article • Journal of Integrated Circuits and Systems, August 2021, Journal of Integrated Circuits and Systems

    Cristina Meinhardt

  29. Design of Energy-Efficient Gaussian Filters by Combining Refactoring and Approximate Adders

    Article • May 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  30. Fast Logic Optimization Using Decision Trees

    Article • May 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  31. Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions

    Article • Journal of Electronic Testing, April 2021, Springer Science + Business Media

    Cristina Meinhardt

  32. Current Behavior on Process Variability Aware FinFET Inverter Designs

    Article • February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  33. Soft Error Sensibility Window at FinFET DICE SRAM

    Article • February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  34. Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit

    Article • February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  35. Logic Synthesis Meets Machine Learning: Trading Exactness for Generalization

    Article • February 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt, Dr. Rasit O Topaloglu

  36. EDAS2020: IEEE CASS/CEDA Seasonal School on Electronic Design Automation [CAS Society News]

    Article • IEEE Circuits and Systems Magazine, January 2021, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  37. Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

    Article • January 2021, Springer Science + Business Media

    Cristina Meinhardt

  38. Energy-Efficient Design of Approximated Full Adders

    Article • November 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  39. Mirror Full Adder SET Susceptibility on 7nm FinFET Technology

    Article • November 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  40. Circuit design using Schmitt Trigger to reliability improvement

    Article • Microelectronics Reliability, November 2020, Elsevier

    Cristina Meinhardt

  41. Soft Error Impact on FinFET and CMOS XOR Logic Gates

    Article • Journal of Integrated Circuits and Systems, August 2020, Journal of Integrated Circuits and Systems

    Cristina Meinhardt

  42. A Fine-grained Methodology for Accuracy-configurable and Energy-efficient Gaussian Filters Design

    Article • August 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  43. Mitigation Effects of Decoupling Cells on Full Adders Process Variability

    Article • August 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  44. Circuit Level Design Methods to Mitigate Soft Errors

    Article • March 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  45. Soft Error Reliability of SRAM cells during the three operation states

    Article • March 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  46. Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters

    Article • March 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  47. Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology

    Article • IEEE Transactions on Circuits and Systems I Regular Papers, February 2020, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  48. Process Variability Impact on the SET Response of FinFET Multi-level Design

    Article • January 2020, Springer Science + Business Media

    Cristina Meinhardt

  49. Robust FinFET Schmitt Trigger Designs for Low Power Applications

    Article • January 2020, Springer Science + Business Media

    Cristina Meinhardt

  50. FBM: A Simple and Fast Algorithm for Placement Legalization

    Article • November 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  51. FinFET Variability and Near-threshold operation: Impact on Full Adders design using XOR Blocks

    Article • November 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  52. Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology

    Article • November 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  53. Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility

    Article • November 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  54. Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  55. Evaluation of SET under Process Variability on FinFET Multi-level Design

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  56. Impact of Process Variability and Single Event Transient on FinFET Technology

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  57. Minimum Energy FinFET Schmitt Trigger Design Considering Process Variability

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  58. Robustness and Minimum Energy-Oriented FinFET Design

    Article • October 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  59. Circuit-Level Hardening Techniques to Mitigate Soft Errors in FinFET Logic Gates

    Article • September 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  60. Gate mapping impact on variability robustness in FinFET technology

    Article • Microelectronics Reliability, September 2019, Elsevier

    Cristina Meinhardt

  61. Mitigation of process variability effects using decoupling cells

    Article • Microelectronics Reliability, September 2019, Elsevier

    Cristina Meinhardt

  62. Exploring Schmitt Trigger Circuits for Process Variability Mitigation

    Article • June 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  63. A library for services transparent replication

    Article • April 2019, ACM (Association for Computing Machinery)

    Cristina Meinhardt

  64. Process Variability Challenges for Radiation Mitigation Techniques on 16nm

    Article • February 2019, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  65. Exploring MAS to a High Level Abstration NoC Simulation Environment

    Article • December 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  66. Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells

    Article • December 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  67. Impact of Near-Threshold and Variability on 7nm FinFET XOR Circuits

    Article • December 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  68. Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements

    Article • October 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  69. Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies

    Article • Microelectronics Reliability, September 2018, Elsevier

    Cristina Meinhardt

  70. Evaluation of variability using Schmitt trigger on full adders layout

    Article • Microelectronics Reliability, September 2018, Elsevier

    Cristina Meinhardt

  71. Impact of different transistor arrangements on gate variability

    Article • Microelectronics Reliability, September 2018, Elsevier

    Cristina Meinhardt

  72. 16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and Aging Effects

    Article • August 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  73. Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders

    Article • May 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  74. Reliability evaluation of circuits designed in multi- and single-stage versions

    Article • February 2018, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  75. Comparing 32nm full adder TMR and DTMR architectures

    Article • December 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  76. Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders

    Article • December 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  77. SET response of FinFET-based majority voter circuits under work-function fluctuation

    Article • December 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  78. Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices

    Article • December 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  79. Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR Circuits

    Article • October 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  80. Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition

    Article • Microelectronics Reliability, September 2017, Elsevier

    Cristina Meinhardt

  81. Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology

    Article • Microelectronics Reliability, September 2017, Elsevier

    Cristina Meinhardt

  82. Robustness of Sub-22nm multigate devices against physical variability

    Article • May 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  83. Radiation sensitivity of XOR topologies in multigate technologies under voltage variability

    Article • February 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  84. Robustness evaluation of finFET transistors under PVT variability

    Article • February 2017, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  85. Geometric variability impact on 7nm Trigate combinational cells

    Article • December 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Ygor Aguiar, Cristina Meinhardt

  86. PVT variability analysis of FinFET and CMOS XOR circuits at 16nm

    Article • December 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  87. Permanent and single event transient faults reliability evaluation EDA tool

    Article • Microelectronics Reliability, September 2016, Elsevier

    Ygor Aguiar, Cristina Meinhardt

  88. Investigating PVT variability effects on full adders

    Article • September 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  89. Inserting permanent fault input dependence on PTM to improve robustness evaluation

    Article • August 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  90. FinFET cells with different transistor sizing techniques against PVT variations

    Article • May 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  91. A probabilistic model for stuck-on faults in combinational logic gates

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  92. Reliability analysis of majority voters under permanent faults

    Article • April 2016, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  93. An evaluation of BTI degradation of 32nm standard cells

    Article • December 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  94. Process variability in FinFET standard cells with different transistor sizing techniques

    Article • December 2015, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  95. Impact of PVT variability on 20 nm FinFET standard cells

    Article • Microelectronics Reliability, August 2015, Elsevier

    Cristina Meinhardt

  96. Impact of gate workfunction fluctuation on FinFET standard cells

    Article • December 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  97. Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices

    Article • September 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  98. Predictive evaluation of electrical characteristics of sub-22nm FinFET technologies under device geometry variations

    Article • Microelectronics Reliability, September 2014, Elsevier

    Cristina Meinhardt

  99. Perfomance Improvement with Dedicated Transistor Sizing for MOSFET and FinFET Devices

    Article • July 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  100. Comparing high-performance cells in CMOS bulk and FinFET technologies

    Article • February 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  101. Exploring more efficient architectures for Multiple Dynamic Supply Voltage designs

    Article • February 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  102. A novel approach to reduce power consumption in level shifter for Multiple Dynamic Supply Voltage

    Article • December 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  103. A yield-driven regular layout synthesis

    Article • August 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  104. FinFET basic cells evaluation for regular layouts

    Article • February 2013, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  105. Evaluation of process variability on current for nanotechnologies devices

    Article • February 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  106. A Low-Cost Solution for Deploying Processor Cores in Harsh Environments

    Article • IEEE Industrial Electronics Magazine, July 2011, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  107. An On-board Data-Handling Computer for Deep-Space Exploration Built Using Commercial-Off-the-Shelf SRAM-Based FPGAs

    Article • October 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  108. Recovery scheme for hardening system on programmable chips

    Article • March 2009, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  109. Logic and Physical Synthesis of Cell Arrays

    Article • December 2007, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  110. orBDDs Direct Mapping for Structured Logic Circuits

    Article • December 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  111. Design of Regular Layouts to Improve Predictability

    Article • April 2006, Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt

  112. A Regular Layout Approach for ASICs

    Article • Institute of Electrical & Electronics Engineers (IEEE)

    Cristina Meinhardt