All Stories

  1. Effects of ultra-shallow ion implantation from RF plasma onto electrical properties of 4H-SiC MIS structures with SiO x /HfO x and SiO x N y /HfO x double-gate dielectric stacks

    Article • Microelectronic Engineering, June 2017, Elsevier

    Piotr Konarski

  2. Hydrogen content influence on tribological properties of nc-WC/a-C:H coatings

    Article • Diamond and Related Materials, August 2016, Elsevier

    Piotr Konarski

  3. Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, March 2016, Elsevier

    Piotr Konarski

  4. Depth Profile Analysis of Phosphorus Implanted SiC Structures

    Article • Acta Physica Polonica A, November 2015, Institute of Physics, Polish Academy of Sciences

    Piotr Konarski

  5. Chlorine-enhanced thermal oxides growth and significant trap density reduction at SiO2/SiC interface by incorporation of phosphorus

    Article • Thin Solid Films, September 2015, Elsevier

    Piotr Konarski

  6. Influence of Phosphorus Implantation on Electrical Properties of Al/SiO2/4H-SiC MOS Structure

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Piotr Konarski

  7. Selection of Processing Parameters for the Conversion Coatings on High-Strength Aluminum Alloys by Cyclic Voltammetry

    Article • Materials Science, March 2015, Springer Science + Business Media

    Piotr Konarski

  8. Quantitative SIMS analysis with the use of "storing matter" technique

    Article • Surface and Interface Analysis, September 2014, Wiley

    Piotr Konarski

  9. Micropump for Generation and Control of Vacuum Inside Miniature Devices

    Article • Journal of Microelectromechanical Systems, February 2014, Institute of Electrical & Electronics Engineers (IEEE)

    Piotr Konarski

  10. Plasma deposition of thin layers containing titanium and barium with the use of DBD

    Article • The European Physical Journal Applied Physics, February 2013, EDP Sciences

    Dr Teresa Opalińska, Piotr Konarski

  11. SIMS studies of titanium biomaterial hydrogenation after magnetoelectropolishing

    Article • Surface and Coatings Technology, May 2012, Elsevier

    Piotr Konarski

  12. Generation and Control of Vacuum Inside Miniature Devices

    Article • Procedia Engineering, January 2012, Elsevier

    Piotr Konarski

  13. SIMS analysis of hydrogen content in near surface layers of AISI 316L SS after electrolytic polishing under different conditions

    Article • Surface and Coatings Technology, May 2011, Elsevier

    Piotr Konarski

  14. Surface characteristics of glass fibres covered with an aluminum layer after a chemical modification process using secondary ion mass spectrometry (SIMS) and atomic force microscopy (AFM)

    Article • International Journal of Mass Spectrometry, September 2009, Elsevier

    Piotr Konarski

  15. SIMS and GDMS depth profile analysis of hard coatings

    Article • Vacuum, June 2008, Elsevier

    Piotr Konarski

  16. Application of r.f. plasma ultrashallow nitrogen ion implantation for pedestal oxynitride layer formation

    Article • Vacuum, June 2008, Elsevier

    Piotr Konarski

  17. Quadrupole-based glow discharge mass spectrometer: Design and results compared to secondary ion mass spectrometry analyses

    Article • Vacuum, June 2007, Elsevier

    Piotr Konarski

  18. RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

    Article • Applied Surface Science, July 2006, Elsevier

    Piotr Konarski

  19. Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMS

    Article • Applied Surface Science, July 2006, Elsevier

    Piotr Konarski

  20. SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment

    Article • Applied Surface Science, July 2006, Elsevier

    Piotr Konarski

  21. Formation of Pedestal Oxynitride Layer by Extremely Shallow Nitrogen Implantation in Planar R.F. Plasma Reactor

    Article • January 2006, The Electrochemical Society

    Piotr Konarski

  22. SIMS investigation of nitride coatings

    Article • Vacuum, May 2005, Elsevier

    Piotr Konarski

  23. Ion beam shadowing effects in SIMS depth profile analysis of MBE-grown nanostructures

    Article • Vacuum, May 2005, Elsevier

    Piotr Konarski

  24. Core–shell morphology of welding fume micro- and nanoparticles

    Article • Vacuum, March 2003, Elsevier

    Piotr Konarski

  25. SIMS depth profiling of working environment nanoparticles

    Article • Applied Surface Science, January 2003, Elsevier

    Piotr Konarski

  26. B4C/Mo/Si and Ta2O5/Ta nanostructures analysed by ultra-low energy argon ion beams

    Article • Applied Surface Science, January 2003, Elsevier

    Piotr Konarski

  27. Morphology of working environment microparticles

    Article • Vacuum, August 2001, Elsevier

    Piotr Konarski

  28. Ion sputtering of microparticles in SIMS depth profile analysis

    Article • Vacuum, August 2001, Elsevier

    Piotr Konarski

  29. Ultrahigh vacuum manipulator for sample rotation in secondary ion mass spectrometry depth profile analysis

    Article • Review of Scientific Instruments, September 1995, American Institute of Physics

    Piotr Konarski

  30. Medium-energy ion scattering study of the initial stage of oxidation of Fe(001)

    Article • March 1989, American Physical Society (APS)

    Piotr Konarski

  31. Dielectric Studies of the Ordering Due to an External DC Electric Field in Nematic 4,4′-di-n-hexyloxyazoxybenzene

    Article • January 1978, Taylor & Francis

    Piotr Konarski

  32. Influence of the Temperature on Electronic Properties of Carbon-Rich BN Films Obtained from (C2H5)3B by Means of Reactive Pulse Plasma Method

    Article • Springer Science + Business Media

    Piotr Konarski