Perspectives of controlled GeSi dots on prepatterned Si (001) substrates

Zhenyang Zhong
  • Journal of Material Science & Engineering, January 2012, OMICS Publishing Group
  • DOI: 10.4172/2169-0022.1000e104

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http://dx.doi.org/10.4172/2169-0022.1000e104

The following have contributed to this page: Professor Zhenyang Zhong