Microscopic FCA System for Depth-Resolved Carrier Lifetime Measurement in SiC

Shinichi Mae, Takeshi Tawara, Hidekazu Tsuchida, Masashi Kato
  • Materials Science Forum, June 2018, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.924.269

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http://dx.doi.org/10.4028/www.scientific.net/msf.924.269

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