Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer

Atsushi Yoshida, Masashi Kato, Masaya Ichimura
  • Materials Science Forum, May 2012, Trans Tech Publications
  • DOI: 10.4028/www.scientific.net/msf.717-720.305

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http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.305

The following have contributed to this page: Masashi Kato

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