What is it about?
This article investigates, in a broad view, what fundamental changes the new industrial revolution led by AI is bringing to us, how AI, IoT, digital trust & security, and other enabling technologies come together to drive almost every aspect of our society, including engineering, in a revolutionary course, how digitalization is transforming the engineering and scientific paradigms, what are potential directions for new engineering paradigms, what are significant challenges, how trustworthiness of systems evolve, and why trustworthy AI systems are critical.
Featured Image
Photo by Conny Schneider on Unsplash
Why is it important?
This article reveals the pattern of industrial revolutions; it shows a roadmap of how engineering practices and approaches need to adapt, including moving from information-centered to machine intelligence-centered, from digitizing to digitalizing processes, and from centralized to distributed and pervasive mode. It highlights ubiquitous machine intelligence, digitalization, and digital trust as pivotal new elements in future engineering. The article provides a comprehensive and forward-looking perspective on digital engineering, AI, and digital trust for future engineering.
Perspectives
The recent achievements of Large Language Models (LLMs), as demonstrated by ChatGPT, mark a significant step towards Artificial General Intelligence and shed light on the power of AI. The powerful and broad impacts of LLMs, on the one hand, demonstrate the leading role of AI in the new industrial revolution; on the other hand, it also further raises the alarm on the importance of trustworthy AI. When integrating AI in digital transformation for any field, including engineering, we must incorporate digital trust mechanisms.
Jingwei Huang
University of Texas Southwestern Medical Center
Read the Original
This page is a summary of: Digital engineering transformation with trustworthy AI towards industry 4.0: emerging paradigm shifts, Journal of Integrated Design and Process Science, October 2023, IOS Press,
DOI: 10.3233/jid-229010.
You can read the full text:
Contributors
The following have contributed to this page
