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This page is a summary of: Quantitative Validation of Enhanced Matching Stability in Octogonal MOSFETs Under X-ray Radiation: A Multivariate Statistical and Predic-tive Modeling Approach, Journal of Integrated Circuits and Systems, August 2026, Journal of Integrated Circuits and Systems,
DOI: 10.29292/jics.v21i2.1167.
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