AFM in surface finishing: Part IV. Force–distance curves

J. R. Smith, S. Breakspear, R. J. R. Fletcher, S. A. Campbell
  • Transactions of the IMF, April 2005, Taylor & Francis
  • DOI: 10.1179/002029605x38979

Quantitative measurements using the atomic force microscope

What is it about?

This tutorial type paper describes the use of the atomic force microscope (AFM), normally used for high-resolution imaging, for obtaining quantitative material properties such as stiffness and adhesion.

Why is it important?

This paper is the 4th in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. Papers 1 to 3, referenced in the 4th article, focus on imaging, surface roughness and friction, respectively. They should be especially suited for those engaged in surface engineering. This 4th paper turns 10 years old in 2015, but the fundamentals remain the same.

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The following have contributed to this page: Dr James R Smith

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