What is it about?

This tutorial type paper describes the use of the atomic force microscope (AFM), normally used for high-resolution imaging, for obtaining quantitative material properties such as stiffness and adhesion.

Featured Image

Why is it important?

This paper is the 4th in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. Papers 1 to 3, referenced in the 4th article, focus on imaging, surface roughness and friction, respectively. They should be especially suited for those engaged in surface engineering.


A free post-print version will be added to the Resources section shortly.

Dr James R Smith
University of Portsmouth

Read the Original

This page is a summary of: AFM in surface finishing: Part IV. Force–distance curves, Transactions of the IMF, April 2005, Taylor & Francis,
DOI: 10.1179/002029605x38979.
You can read the full text:



The following have contributed to this page