Drain Leakage Current Evaluation in the Diamond SOI nMOSFET at High Temperatures

  • Marcello Bellodi, Salvador Pinillos Gimenez
  • January 2009, The Electrochemical Society
  • DOI: 10.1149/1.3204412

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1149/1.3204412

The following have contributed to this page: Dr Salvador Pinillos Gimenez