Hardware Error Likelihood Induced by the Operation of Software

Bing Huang, Manuel Rodriguez, Ming Li, Joseph B. Bernstein, Carol S. Smidts
  • IEEE Transactions on Reliability, September 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2011.2161699

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http://dx.doi.org/10.1109/tr.2011.2161699

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