Hardware Error Likelihood Induced by the Operation of Software

Bing Huang, Manuel Rodriguez, Ming Li, Joseph B. Bernstein, Carol S. Smidts
  • IEEE Transactions on Reliability, September 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2011.2161699

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication


The following have contributed to this page: Joseph Bernstein