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http://dx.doi.org/10.1109/tr.2005.853278
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New Cumulative Damage Models for Failure Using Stochastic Processes as Initial Damage
- C. Park, W.J. Padgett
- IEEE Transactions on Reliability, September 2005, Institute of Electrical & Electronics Engineers (IEEE)
- DOI: 10.1109/tr.2005.853278
