New Cumulative Damage Models for Failure Using Stochastic Processes as Initial Damage

  • C. Park, W.J. Padgett
  • IEEE Transactions on Reliability, September 2005, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/tr.2005.853278

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http://dx.doi.org/10.1109/tr.2005.853278

The following have contributed to this page: Professor Chanseok Park