Experimental comparative study between the diamond MOSFET and its conventional counterpart in high temperatures environment

  • Egon H. S. Galembeck, Christian Renaux, Denis Flandre, Salvador P. Gimenez
  • October 2013, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/s3s.2013.6716568

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1109/s3s.2013.6716568

The following have contributed to this page: Dr Salvador Pinillos Gimenez