FaRBS: A new PoF based VLSI reliability prediction method

Jin Qin, Hava Avshalom, Joseph B. Bernstein
  • January 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/rams.2011.5754493

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http://dx.doi.org/10.1109/rams.2011.5754493

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