Publication not explained
This publication has not yet been explained in plain language by the author(s). However, you can still read the publication.
If you are one of the authors, claim this publication so you can create a plain language summary to help more people find, understand and use it.
Featured Image
Read the Original
This page is a summary of: Inv estigation by the Method of Images of the Heat Flux Distribution at the Semiconductor-Substrate Interface in Transistor Structure from a Point Heat Source Located at the Passivation-Semiconductor Interface, March 2020, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/mwent47943.2020.9067473.
You can read the full text:
Contributors
The following have contributed to this page
