Quantitatively analyzing the performance of integrated circuits and their reliability

Edward J Wyrwas, Joseph B Bernstein
  • IEEE Instrumentation and Measurement Magazine, February 2011, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/mim.2011.5704807

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http://dx.doi.org/10.1109/mim.2011.5704807

The following have contributed to this page: Joseph Bernstein