3D inspection of fabrication and degradation processes from X-ray (micro) tomography images using a hole closing algorithm

L. Babout, M. Janaszewski, D. Bakavos, S.A. McDonald, P.B Prangnell, T.J. Marrow, P.J. Withers
  • July 2010, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/ist.2010.5548537

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http://dx.doi.org/10.1109/ist.2010.5548537

The following have contributed to this page: Prof Thomas J Marrow and Professor Philip J Withers