Reliability Simulation and Design Consideration of High Speed ADC Circuits

Baoguang Yan, Jin Qin, Jun Dai, Qingguo Fan, Joseph B. Bernstein
  • October 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/irws.2008.4796102

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http://dx.doi.org/10.1109/irws.2008.4796102

The following have contributed to this page: Joseph Bernstein