Study of Transistor and Product NBTI Lifetime Distributions

Jin Qin, Baoguang Yan, Yossi Shoshany, Druker Roy, Hezi Rahamim, Haim Marom, Joseph B. Bernstein
  • October 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/irws.2008.4796088

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http://dx.doi.org/10.1109/irws.2008.4796088

The following have contributed to this page: Joseph Bernstein