SRAM stability analysis considering gate oxide SBD, NBTI and HCI

Joseph B. Bernstein, Jin Qin, Xiaojun Li
  • October 2007, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/irws.2007.4469217

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http://dx.doi.org/10.1109/irws.2007.4469217

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