Product Reliability Trends, Derating Considerations and Failure Mechanisms with Scaled CMOS

Mark White, Duc Vu, Duc Nguyen, Ron Ruiz, Yuan Chen, Joseph Bernstein
  • October 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/irws.2006.305234

The authors haven't finished explaining this publication. If you are the author, sign in to claim or explain your work.

Read Publication

http://dx.doi.org/10.1109/irws.2006.305234

The following have contributed to this page: Joseph Bernstein