Non-Arrhenius Temperature Acceleration and Stress-Dependent Voltage Acceleration for Semiconductor Device Involving Multiple Failure Mechanisms

Jin Qin, Joseph Bernstein
  • October 2006, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/irws.2006.305219

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http://dx.doi.org/10.1109/irws.2006.305219

The following have contributed to this page: Joseph Bernstein