What is it about?
A process and temperature variation tolerant SRAM cell aging (BTI related) monitoring circuit and technique is presented in this work.
Featured Image
Why is it important?
This is a process and temperature variation tolerant technique. Aging monitoring and repair in SRAMs.
Read the Original
This page is a summary of: Variation tolerant BTI monitoring in SRAM cells, July 2017, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/iolts.2017.8046203.
You can read the full text:
Contributors
The following have contributed to this page
