Simulating the effects of atrial fibrillation induced electrical remodeling: A comprehensive simulation study

Sanjay Kharche, Henggui Zhang
  • August 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/iembs.2008.4649222

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http://dx.doi.org/10.1109/iembs.2008.4649222

The following have contributed to this page: Henggui Zhang