Effect of Boundary Conditions on the Dynamic Response Characterization Of Board-Level Drop Test

Seungbae Park, Chirag Shah, Jae Kwak
  • December 2007, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/eptc.2007.4469810

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http://dx.doi.org/10.1109/eptc.2007.4469810

The following have contributed to this page: Dr Jae B Kwak