Optimal safety of conduction through the Purkinje-ventricular junction

P. Stewart, O.V. Aslanidi, M.R. Boyett, H. Zhang
  • September 2008, Institute of Electrical & Electronics Engineers (IEEE)
  • DOI: 10.1109/cic.2008.4749038

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http://dx.doi.org/10.1109/cic.2008.4749038

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