What is it about?

Strict privacy rules stop hospitals from pooling patient records in one place. Federated learning lets each hospital train locally and share only model parameters, not raw data. Most frameworks, however, support deep neural nets that are resource-hungry and hard to interpret. Our work builds the first Random-Forest-based federated toolkit in PySyft so hospitals and labs can train transparent, CPU-friendly models collaboratively while fully complying with GDPR. Tests on AIDS and diabetic-retinopathy datasets showed the federated model stays within 0.3–9 percentage points of a centralised baseline, proving that tree-based methods can compete without compromising privacy.

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Why is it important?

- Brings interpretability to federated AI. Clinicians can inspect feature importance instead of trusting a “black box.” - Slashes hardware costs. Random Forests run on commodity CPUs—no GPUs or cloud accelerators needed—making privacy-preserving analytics affordable for smaller hospitals. - Closes a tooling gap. Until now, federated-learning libraries lacked native support for tree-based models; our open-source package (fed_rf_mk) fills that void and is already live on GitHub and PyPI. - Sets the stage for safer data sharing. By keeping data on-premise, hospitals meet GDPR and HIPAA obligations while still benefiting from multi-site evidence.

Perspectives

Working on this article was particularly exciting because it combines three areas I care about deeply: privacy, explainable AI, and healthcare impact. Random Forests offer clarity that black-box models can’t, and I believe this project shows how ethical, high-impact AI is not only possible—it’s ready to be used today. We hope this sparks collaborations with hospitals, biobanks, and researchers who want to train smarter models without compromising privacy.

Dr. Jorge Miguel Silva
Universidade de Aveiro

Read the Original

This page is a summary of: A Federated Random Forest Solution for Secure Distributed Machine Learning, June 2025, Institute of Electrical & Electronics Engineers (IEEE),
DOI: 10.1109/cbms65348.2025.00159.
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