What is it about?
The underfill process of flip-chip encapsulation was vital in promoting the package reliability. We study for the first time on the spatial aspects of underfill flow, including meniscus evolution and void formation. The latter is identified as a threat to the package reliability.
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This page is a summary of: Spatial analysis of underfill flow in flip-chip encapsulation, Soldering & Surface Mount Technology, September 2020, Emerald,
DOI: 10.1108/ssmt-05-2020-0017.
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