What is it about?

The underfill process of flip-chip encapsulation was vital in promoting the package reliability. We study for the first time on the spatial aspects of underfill flow, including meniscus evolution and void formation. The latter is identified as a threat to the package reliability.

Featured Image

Read the Original

This page is a summary of: Spatial analysis of underfill flow in flip-chip encapsulation, Soldering & Surface Mount Technology, September 2020, Emerald,
DOI: 10.1108/ssmt-05-2020-0017.
You can read the full text:

Read

Contributors

The following have contributed to this page