What is it about?
When diffractometers had point detectors, the "goniometers" could determine 3D diffraction angles with extraordinary precision. Now that they have integrating area detectors, reflection positions are determined basically in 2D, with only a rough hint on the third dimension. We found a handy way to determine the third dimension with high precision, making it possible to index difficult crystals such as samples with multiple crystals or modulated structures.
The following have contributed to this page: Rob Hooft