High-energy x-ray reflectivity of buried interfaces created by wafer bonding

D. Buttard, R. Oeser, O. Plantevin, H. Moriceau, B. Aspar, F. Rieutord, J. Eymery, F. Fournel
  • March 2001, American Physical Society (APS)
  • DOI: 10.1103/physrevb.63.125408

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The following have contributed to this page: Dr Joel Eymery