The angular- and crystal-momentum transfer through electron–phonon coupling in silicon and silicon-carbide: similarities and differences

What is it about?

This work show that (resonant) x-ray emission spectroscopy can be used to obtain information on the rates of electron-phonon scattering in semiconductors, in this case silicon carbide. It also distinguishes the electron-phonon scattering leading to crystal momentum or angular momentum transfer.

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Why is it important?

While different degrees of freedom (spin, orbital, crystal structure) in materials determine its functionality it is important to understand the correlation between these degrees of freedom. In this paper we show that x-ray emission spectroscopy can be used to study tthe electron-phonon interaction.