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A scanner is a very important part of an atomic force microscope. We have demonstrated by fabricating a scanner that can be easily integrated onto an inverted optical microscope for concurrent static and dynamic analysis of samples.

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This page is a summary of: Comparative study of two types of parallel kinematic flexure scanners for atomic force microscopy, Instrumentation Science & Technology, June 2017, Taylor & Francis,
DOI: 10.1080/10739149.2017.1337640.
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