The impact of scaling on single event upset in 6T and 12T SRAMs from 130 to 22 nm CMOS technology

N. S. Yusop, A. N. Nordin, M. Azim Khairi, N. F. Hasbullah
  • Radiation Effects and Defects in Solids, November 2018, Taylor & Francis
  • DOI: 10.1080/10420150.2018.1542695

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http://dx.doi.org/10.1080/10420150.2018.1542695

The following have contributed to this page: Anis Nurashikin Nordin