The impact of scaling on single event upset in 6T and 12T SRAMs from 130 to 22 nm CMOS technology

  • N. S. Yusop, A. N. Nordin, M. Azim Khairi, N. F. Hasbullah
  • Radiation Effects and Defects in Solids, November 2018, Taylor & Francis
  • DOI: 10.1080/10420150.2018.1542695

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http://dx.doi.org/10.1080/10420150.2018.1542695

The following have contributed to this page: Anis Nurashikin Nordin