AFM in Surface Finishing: Part III. Lateral Force Microscopy and Friction Measurements

Steven Breakspear, James R. Smith, Sheelagh A. Campbell
  • Transactions of the IMF, January 2003, Taylor & Francis
  • DOI: 10.1080/00202967.2003.11871509

Measuring friction with the atomic force microscope

Photo by Michael Longmire on Unsplash

Photo by Michael Longmire on Unsplash

What is it about?

This tutorial type paper describes the use of the atomic force microscope (AFM), normally used for high-resolution imaging, for obtaining informatuon about the frictional properties of materials.

Why is it important?

This paper is the 3rd in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. Papers 1 and 2 focus on imaging and obtaining surface roughness, respectively; the 4th paper is about measuring adhesion and stiffness. This paper concerns the measurement of small-scale frictional properties, which cannot be measured using conventional techniques.

Perspectives

Dr James R Smith
University of Portsmouth

A free post-print version will be added to the Resources section shortly.

Read Publication

http://dx.doi.org/10.1080/00202967.2003.11871509

The following have contributed to this page: Dr James R Smith

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