What is it about?
This tutorial type paper describes the use of the atomic force microscope (AFM), normally used for high-resolution imaging, for obtaining informatuon about the frictional properties of materials.
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Why is it important?
This paper is the 3rd in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. Papers 1 and 2 focus on imaging and obtaining surface roughness, respectively; the 4th paper is about measuring adhesion and stiffness. This paper concerns the measurement of small-scale frictional properties, which cannot be measured using conventional techniques.
Perspectives
A free post-print version will be added to the Resources section shortly.
Dr James R Smith
University of Portsmouth
Read the Original
This page is a summary of: AFM in Surface Finishing: Part III. Lateral Force Microscopy and Friction Measurements, Transactions of the IMF, January 2003, Taylor & Francis,
DOI: 10.1080/00202967.2003.11871509.
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