AFM in Surface Finishing: Part I. An Introduction

James R. Smith, Steven Breakspear, Sheelagh A. Campbell
  • Transactions of the IMF, January 2003, Taylor & Francis
  • DOI: 10.1080/00202967.2003.11871484

Introduction to atomic force microscopy

Photo by Michael Longmire on Unsplash

Photo by Michael Longmire on Unsplash

What is it about?

This tutorial type paper describes the use of the atomic force microscope (AFM), a high-resolution imaging technique for examing a range of different materials.

Why is it important?

This paper is the 1st in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. This first paper provides an introduction and concentrates on the imaging aspects. Papers 2 to 4 focus on quantitative AFM methods such as measuring surface roughness, friction, adhesion and stiffness.

Perspectives

Dr James R Smith
University of Portsmouth

A free post-print version will be added to the Resources section shortly.

Read Publication

http://dx.doi.org/10.1080/00202967.2003.11871484

The following have contributed to this page: Dr James R Smith

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