Introduction to atomic force microscopy
Photo by Michael Longmire on Unsplash
What is it about?
This tutorial type paper describes the use of the atomic force microscope (AFM), a high-resolution imaging technique for examing a range of different materials.
Why is it important?
This paper is the 1st in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. This first paper provides an introduction and concentrates on the imaging aspects. Papers 2 to 4 focus on quantitative AFM methods such as measuring surface roughness, friction, adhesion and stiffness.
The following have contributed to this page: Dr James R Smith
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