What is it about?

This tutorial type paper describes the use of the atomic force microscope (AFM), a high-resolution imaging technique for examing a range of different materials.

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Why is it important?

This paper is the 1st in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. This first paper provides an introduction and concentrates on the imaging aspects. Papers 2 to 4 focus on quantitative AFM methods such as measuring surface roughness, friction, adhesion and stiffness.


A free post-print version will be added to the Resources section shortly.

Dr James R Smith
University of Portsmouth

Read the Original

This page is a summary of: AFM in Surface Finishing: Part I. An Introduction, Transactions of the IMF, January 2003, Taylor & Francis,
DOI: 10.1080/00202967.2003.11871484.
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