Measuring surface roughness with the atomic force microscope
Photo by Etienne Martin on Unsplash
What is it about?
This tutorial type paper describes the use of the atomic force microscope (AFM), normally used for high-resolution imaging, for obtaining informatuon about the surface roughness of materials.
Why is it important?
This paper is the 2nd in a short series of tutorial papers concerning the practical aspects of AFM aimed at readers with little prior knowledge about the technique. Paper 1 describes the basics of AFM including such as imaging. Papers 3 and 4 describe the use of the technique to acquire friction, adhesion and stiffness information. This paper concerns the measurement of roughness of surfaces, which is an important property that can partly determine the suitability of the material for certain applications.
The following have contributed to this page: Dr James R Smith
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