What is it about?
The article investigates the destructive breakdown of thin muscovite mica, an emerging gate dielectric in electronics. By electrically stressing mica-based capacitors, we find the electrical breakdown leads to material damage, including crater formation, even at low current densities. We suggest that potassium ions within the mica may contribute to this effect. Additionally, the work highlights the importance of controlling experimental variables used in the electrical stressing leading to DBD.
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This page is a summary of: Destructive dielectric breakdown of 2D muscovite mica, Applied Physics Letters, September 2024, American Institute of Physics,
DOI: 10.1063/5.0222048.
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